2016
DOI: 10.1111/ggr.12123
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Zircon M127 – A Homogeneous Reference Material for SIMS U–Pb Geochronology Combined with Hafnium, Oxygen and, Potentially, Lithium Isotope Analysis

Abstract: IntroductionThe development of the SIMS (secondary ion mass spectrometry) technique opened the world of high spatial resolution determination of U-Pb ages from polished zircon surfaces (e.g., Andersen and Hinthorne 1972; Compston et al. 1984; Williams 1998). The SIMS technique is a comparative method and the determination of accurate isotopic ratios in zircon requires calibration of the unknown results against the results of a well-characterized calibrant material measured under identical conditions during the… Show more

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Cited by 50 publications
(41 citation statements)
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“…) or 0.092‰ (1 s , n = 100, Nasdala et al . ) on silicates, which is reasonably typical of SIMS of this specification. Briefly, a 2.5 nA 133 Cs + primary beam, operating in Gaussian mode, was focused to a ~ 5‐μm‐diameter spot on the surface of the highly polished sample.…”
Section: Methodsmentioning
confidence: 75%
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“…) or 0.092‰ (1 s , n = 100, Nasdala et al . ) on silicates, which is reasonably typical of SIMS of this specification. Briefly, a 2.5 nA 133 Cs + primary beam, operating in Gaussian mode, was focused to a ~ 5‐μm‐diameter spot on the surface of the highly polished sample.…”
Section: Methodsmentioning
confidence: 75%
“… and Nasdala et al . ). When the results from a single analysis are based on an integrated mean for the full 80 s of data acquisition, variations in secondary ion emission conditions (sample charging, primary ion flickering, etc.)…”
Section: Discussionmentioning
confidence: 97%
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“…We also used the Potsdam CAMECA 1280-HR instrument to perform δ 18 O determinations on zircon, largely following the method described in Nasdala et al (2016). Briefly, the SIMS analyses employed a 2.5 nA, 133 Cs + primary ion beam with a Gaussian intensity distribution with a total impact energy of 20 keV which was rastered over a 10 µm area with the dynamic transfer circuitry activated.…”
Section: Secondary Ion Mass Spectrometry (Sims)mentioning
confidence: 99%
“…Nasdala et al . () proposed the use of a new zircon reference material, M127, which was chemically characterised by electron probe and laser ICP‐MS. The homogeneity of δ 18 O was checked by multiple measurements by SIMS.…”
Section: Advances In Secondary Ion Mass Spectrometrymentioning
confidence: 99%