Zero-shot denoising of microscopy images recorded at high-resolution limits
Sebastian Salwig,
Jakob Drefs,
Jörg Lücke
Abstract:Conventional and electron microscopy visualize structures in the micrometer to nanometer range, and such visualizations contribute decisively to our understanding of biological processes. Due to different factors in recording processes, microscopy images are subject to noise. Especially at their respective resolution limits, a high degree of noise can negatively effect both image interpretation by experts and further automated processing. However, the deteriorating effects of strong noise can be alleviated to … Show more
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