Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopy

Cheng, Guanxiao; Hu, Chao; Xu, Peng; Xing, Tingwen

doi:10.1364/ol.35.003610

Cited by 32 publications

(17 citation statements)

References 12 publications

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“…The apodization parameter may be adjusted to achieve the optimum desired intensity distribution at the focal plane (Cheng et al, 2010(Cheng et al, , 2011. We calculated the PSF intensity distribution of photon sieves with different apodization parameters at focal plane compared with a zone plates.…”

Section: Design Of Photon Sievementioning

confidence: 99%

Emerging Maskless Nanolithography Based on Novel Diffraction Gratings

Cheng¹,

Yang²,

Hu³

et al. 2011

Recent Advances in Nanofabrication Techniques and Applications

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Section: Design Of Photon Sievementioning

confidence: 99%

Emerging Maskless Nanolithography Based on Novel Diffraction Gratings

Cheng¹,

Yang²,

Hu³

et al. 2011

Recent Advances in Nanofabrication Techniques and Applications

Self Cite

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“…In fact, due to its small size, light weight and flexible design, the photon sieve has seen great development since it was invented [13][14][15][16]. So far, a large number of diffractive optical elements based on this type of multi-micropore structure have emerged, such as flat helical nanosieves [17] and ultrahighcapacity non-periodic photon sieves [18].…”

Section: Introductionmentioning

confidence: 99%

Spiral Photon Sieves Apodized by a Bessel-Like Window

Yu¹,

Xiao²,

Yi³

et al. 2017

PIER C

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Abstract-In order to improve the focusing and imaging effects of conventional spiral zone plates (SZPs), we design a new type of spiral photon sieve (SPSs) apodized by a robust Bessel-like window. The design principle and numerical simulation results show that the Bessel-like window has a better modulation effect on the main lobe compression and side suppression of the point spread function (PSF) than other traditional window. Taking advantage of the robustness of Bessel-like windows, the proposed SPS can achieve a higher spatial resolution and lower side lobe noise than the conventional SPS and SZP. The practical effects have also been demonstrated by image experiments on the micropore. Our work may find some potential applications in laser alignment, optical trapping, optical communication and edge enhancement imaging fields.

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“…X-ray imaging is a powerful technique to inspect the features and details of objects which are unable to be viewed using the visible spectrum of light [8][9][10][11][12][13]. Thus, X-ray imaging is a useful tool for the inspection of ICs by examining the details concealed by the packaging surface.…”

Section: Introductionmentioning

confidence: 99%

Real-time automated counterfeit integrated circuit detection using x-ray microscopy

et al. 2015

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Received Month X, XXXX; revised Month X, XXXX; accepted Month X, XXXX; posted Month X, XXXX (Doc. ID XXXXX); published Month X, XXXX Determining the authenticity of integrated circuits is paramount in preventing counterfeit and malicious hardware from being used in critical military, healthcare, aerospace, consumer, and industry applications. Existing techniques to distinguish between authentic and counterfeit integrated circuits often includes destructive testing requiring subject matter experts. We present a non-destructive technique to detect counterfeit integrated circuits using X-ray microscopy and advanced imaging analysis with different pattern recognition approaches. Our proposed method is completely automated, and runs in real time. In our approach, images of an integrated circuit are obtained from an X-ray microscope. Local binary pattern features are then extracted from the X-ray image followed by dimensionality reduction through principal component analysis, and alternatively through a non-linear principal component methodology using a stacked autoencoder embedded in a deep neural network. From the reduced dimension features, we train two types of learning machines, a support vector machine with a non-linear kernel, and a deep neural network. We present experiments using authentic and counterfeit integrated circuits to demonstrate that the proposed approach achieves an accuracy of 100% in distinguishing between the counterfeit and authentic samples.

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Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopy

Cited by 32 publications

References 12 publications

Emerging Maskless Nanolithography Based on Novel Diffraction Gratings

Emerging Maskless Nanolithography Based on Novel Diffraction Gratings

Spiral Photon Sieves Apodized by a Bessel-Like Window

Real-time automated counterfeit integrated circuit detection using x-ray microscopy

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