Z-scan measurement technique for non-Gaussian beams and arbitrary sample thicknesses

Bridges, Robert E.; Fischer, George L.; Boyd, Robert W.

doi:10.1364/ol.20.001821

Cited by 52 publications

(17 citation statements)

References 9 publications

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“…Still, a well characterized and clean input beam profile is required for precise measurements [20]. Bridges et al have demonstrated a technique which partially relaxes the stringent beam shape requirement by measuring the nonlinearity of the sample relative to a reference sample [26]. The key mechanism of the Z-scan technique is to measure the SPM-induced phase shift via its effect on the far-field diffraction pattern.…”

Section: The Z-scan and The Spectral Re-shaping Techniquementioning

confidence: 99%

Measurements of nonlinear refractive index in scattering media

et al. 2010

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We have recently developed a spectral re-shaping technique to simultaneously measure nonlinear refractive index and nonlinear absorption. In this technique, the information about the nonlinearities is encoded in the frequency domain, rather than in the spatial domain as in the conventional Z-scan method. Here we show that frequency encoding is much more robust with respect to scattering. We compare spectral re-shaping and Z-scan measurements in a highly scattering environment and show that reliable spectral re-shaping measurements can be performed even in a regime that precludes standard Z-scans.

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Section: The Z-scan and The Spectral Re-shaping Techniquementioning

confidence: 99%

Measurements of nonlinear refractive index in scattering media

et al. 2010

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“…When the applicability of the thin lens regimel casts some doubt, more complex methods of problem solution are used based on regimeling of the profile of the light beam transmitted through the nonlinear medium [9,10]. It has been demonstrated that non-Gaussian beams can also be used in these experiments [11].…”

Section: Introductionmentioning

confidence: 99%

Z-scan method in a study of lithium niobate with surface doping by photorefractive impurities

et al. 2006

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535.31Doping of the lithium niobate surface significantly modifies its photorefractive characteristics. In the present work, the special features of the Z-scan response are experimentally investigated for lithium niobate with surface doping by ions of iron, copper, and their combinations. In experiments, helium-neon laser radiation with a wavelength of 633 nm and semiconductor laser radiation with a wavelength of 660 nm are used. Dependences of the response characteristics on the character of doping and the intensity and polarization state of probing radiation are obtained for the closed Z-scan scheme.

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“…20 In this method one first makes a Z-scan measurement of a reference sample, the nonlinear optical parameters of which are known. Then the experiment is repeated for a test sample with the input power adjusted to get the same normalized peak-to-valley transmittance as that for the reference sample.…”

Section: Introductionmentioning

confidence: 99%

Two-dimensional Z scan for arbitrary beam shape and sample thickness

Chen

Oulianov

Tomov

et al. 1999

Journal of Applied Physics

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A two-dimensional Z-scan technique has been developed using a two-dimensional charge-coupled device (CCD) detector to study the nonlinear optical properties and beam profile evolution within optical limiting devices. Using the split step beam propagation method, the far field pattern at each Z position can be calculated precisely for any arbitrary beam shape and sample thickness. A two-dimensional far field pattern is recorded by the CCD detector, and the evolution of the beam distribution inside the nonlinear optical medium can be obtained directly. This technique has been applied to study the nonlinear optical parameters and laser beam profiles in nonlinear liquids. We have used thin and thick samples and Gaussian, top-hat and split Gaussian beam distributions, and the experimental results agreed very well with the calculation. This technique also offers a simple and accurate means for optimizing the design of optical limiting devices.

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Z-scan measurement technique for non-Gaussian beams and arbitrary sample thicknesses

Cited by 52 publications

References 9 publications

Measurements of nonlinear refractive index in scattering media

Measurements of nonlinear refractive index in scattering media

Z-scan method in a study of lithium niobate with surface doping by photorefractive impurities

Two-dimensional Z scan for arbitrary beam shape and sample thickness

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