2006
DOI: 10.1088/1742-6596/38/1/035
|View full text |Cite
|
Sign up to set email alerts
|

Z-scan and four-wave mixing characterization of semiconductor cadmium chalcogenide nanomaterials

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2011
2011
2023
2023

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 7 publications
(1 citation statement)
references
References 2 publications
0
1
0
Order By: Relevance
“…In other parts, the nonlinear absorption of nano-suspension was measured. Several different experimental methods can be employed to measure TPA coefficients such us converted fluorescence emission [11], transient absorption [12], four-wave mixing [13] and the z-scan technique [14,15]. Among these methods, the z-scan technique, which was first introduced by Sheik-Bahae et al in 1989 [16], is a particular example.…”
Section: Introductionmentioning
confidence: 99%
“…In other parts, the nonlinear absorption of nano-suspension was measured. Several different experimental methods can be employed to measure TPA coefficients such us converted fluorescence emission [11], transient absorption [12], four-wave mixing [13] and the z-scan technique [14,15]. Among these methods, the z-scan technique, which was first introduced by Sheik-Bahae et al in 1989 [16], is a particular example.…”
Section: Introductionmentioning
confidence: 99%