Yttria-stabilized zirconia thin films by pulsed laser deposition: Microstructural and compositional control

Heiroth, S.; Lippert, Thomas; Wokaun, Alexander; Döbeli, M.; Rupp, Jennifer L. M.; Scherrer, Barbara; Gauckler, Ludwig J.

doi:10.1016/j.jeurceramsoc.2009.06.012

Cited by 73 publications

(60 citation statements)

References 27 publications

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“…The ASR dependence on temperature follows an Arrhenius-type law for both the YSZ and the LSC, with activation energies of E a =1.05(1) eV and E a =1.54(4) eV, respectively. These values are in concordance with previously reported values for the corresponding bulk materials (see [31,54,[56][57][58] for YSZ and [21,22,24,42] for LSC).…”

Section: Accepted Manuscriptsupporting

confidence: 93%

Porous La0.6Sr0.4CoO3−δ thin film cathodes for large area micro solid oxide fuel cell power generators

Garbayo

Esposito

Sanna

et al. 2014

Journal of Power Sources

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Section: Accepted Manuscriptsupporting

confidence: 93%

Porous La0.6Sr0.4CoO3−δ thin film cathodes for large area micro solid oxide fuel cell power generators

Garbayo

Esposito

Sanna

et al. 2014

Journal of Power Sources

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“…The oxygen stoichiometry showed that the metallic elements are fully oxidized and the oxygen stoichiometry is reached even if the films have been grown under vacuum. This result is not in agreement with what Heiroth et al [15] have found for YSZ films deposited onto sapphire substrates by PLD (KrF laser, 4 J/cm 2 and 600°C). These authors evidenced that for oxygen pressures lower than 1 Pa, films are oxygen deficient.…”

Section: %Y Xcontrasting

confidence: 99%

“…This indicates that as-deposited RMS films are very stable under oxidizing conditions. Stability in oxidizing atmosphere is one of the well known properties of YSZ [15]. Thus, in the following, as-deposited RMS and PLD thin films will be presented and compared.…”

Section: Resultsmentioning

confidence: 99%

Yttria-stabilized zirconia thin films deposited by pulsed-laser deposition and magnetron sputtering

Hidalgo

Reguzina

Millon

et al. 2011

Surface and Coatings Technology

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Yttria-stabilized zirconia (YSZ, ZrO 2 :Y 2 O 3 ) was deposited on (100) silicon by two physical vapor deposition techniques: pulsed laser deposition (PLD) and reactive magnetron sputtering (RMS). PLD thin films were grown on silicon substrates at 500°C from the ablation of a 8YSZ ceramic target by a KrF excimer laser. RMS thin films were obtained by direct current magnetron sputtering of a Zr/Y metallic target in an oxygen/argon atmosphere. The deposition rate of the PLD technique using an UV excimer laser delivering pulses at a repetition rate of 40 Hz was found two orders of magnitude lower than the RMS method one. Both techniques led to the growth of crystalline films with a (111) preferential orientation. PLD films were dense and featureless whereas RMS ones exhibited well defined but compact columnar structure. Growth of a YSZ film of about 1 µm covering a rough and porous commercial anode support (NiO-YSZ cermet) was successfully carried out with both methods.

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“…YSZ thin films grown by pulsed laser deposition (PLD) are known to exhibit a columnar morphology with diameters around 20 nm. [7][8][9] This morphology is expected to follow the structure zone model of Thornton 10 and could be overcome by an increase of the deposition temperature. However, with the very high melting point of YSZ above 2900 K, 11 deposition temperatures of at least 1500 K would be required for a significant change of the microstructure on technically relevant substrates.…”

mentioning

confidence: 93%

“…The film has a columnar structure parallel to the surface normal with an average column width of ∼20 nm as reported in literature. [7][8][9] By applying an inclination of 45…”

mentioning

confidence: 99%

Dense zig-zag microstructures in YSZ thin films by pulsed laser deposition

et al. 2015

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The very brittle oxygen ion conductor yttria stabilized zirconia (YSZ) is a typical solid electrolyte for miniaturized thin film fuel cells. In order to decrease the fuel cell operating temperature, the thickness of yttria stabilized zirconia thin films is reduced. Often, these thin membranes suffer from mechanical failure and gas permeability. To improve these mechanical issues, a glancing angle deposition approach is used to grow yttria stabilized zirconia thin films with tilted columnar structures. Changes of the material flux direction during the deposition result in a dense, zigzag-like structure with columnar crystallites. This structure reduces the elastic modulus of these membranes as compared to columnar yttria stabilized zirconia thin films as monitored by nano-indentation which makes them more adaptable to applied stress.

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Yttria-stabilized zirconia thin films by pulsed laser deposition: Microstructural and compositional control

Cited by 73 publications

References 27 publications

Porous La0.6Sr0.4CoO3−δ thin film cathodes for large area micro solid oxide fuel cell power generators

Porous La0.6Sr0.4CoO3−δ thin film cathodes for large area micro solid oxide fuel cell power generators

Yttria-stabilized zirconia thin films deposited by pulsed-laser deposition and magnetron sputtering

Dense zig-zag microstructures in YSZ thin films by pulsed laser deposition

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