“…2(c). 13,[23][24][25][26] This process involves the following steps: (a) positioning of the AFM tip in nanoscopic proximity to but, directly above the NB mid-length using a tapping mode-scan taken prior to the bending test, (b) movement of the sample stage z-piezo to bring the NB sample in contact with AFM tip, thereby inducing out-of-plane deections in both, the tip and the NB, and (c) the recording of the tip deection vs. stage movement (i.e., its z-piezo) plot during this process. If the spring constant of the AFM tip is pre-calibrated (using the Sader's method 13 ), the tip deection vs. z-piezo plot can be converted to the NB force (F NB ) vs. deection (d NB ) plot, as shown in Fig.…”