Abstract:During the fabrication of nano-crossbar arrays, certain amount of defective elements are introduced to the end product which affect the yield drastically. Current literature regarding the yield analysis of nano-crossbar arrays is very rough and limited to the uniform distribution of defect occurrence with a few exceptions. Since density feature of crossbar architectures is the main attracting point, we perform a detailed yield analysis by considering both uniform and non-uniform defect distributions. Firstly, … Show more
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