Y₂O₂S:Eu phosphor screens evaluation

Abstract

The x-ray luminescence of Y2O2S:Eu phosphor screens is studied both in transmission and in reflection mode observation. Detailed experimental data concerning the dependence of the absolute efficiency on the tube voltage and the screen's thickness are presented and comparisons to another rare earth phosphor material (Y2O2S:Tb) are given. With the help of theoretical calculations based on the Hamaker-Ludwig model all the experimental data are explained and the intrinsic efficiency and scattering coefficients of the phosphor are estimated.

A CMOS image sensor method of focal spot size measurement

“…A literature search [12][13][14][15][16] along with a qualitative assessment of several commercially available phosphors suggested the use of gadolinium oxysulphide (Gd 2 O 2 S:Tb), the phosphor used in the construction of the KODAK LANEX Regular screens. A small piece of the actual Kodak Lanex regular screen (7 x 5 mm) with a stated phosphor density of approximately 67 mg/cm 2 was used.…”

X-ray induced luminescence and spatial resolution of phosphor screens

“…La 2 O 2 S:Tb screens were prepared by sedimentation on fused silica substrates as described in previous studies for other phosphor materials (Giakoumakis et al 1990(Giakoumakis et al , 1993. Screen coating thickness varied between 13.6 mg cm −2 and 162 mg cm −2 .…”

“…The experimental set-up adopted for absolute efficiency measurements, comprising a Siemens Stabilipan x-ray unit and a photomultiplier tube with an extended sensitivity S-20 photocathode, has been analytically described in previous papers (Giakoumakis et al 1989(Giakoumakis et al , 1993. Screens were measured under fluoroscopy conditions in both transmission and reflection modes of observation.…”