2019
DOI: 10.1063/1.5098646
|View full text |Cite
|
Sign up to set email alerts
|

XRD and FTIR studies of zinc doped nickel oxide compounds

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
1
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 16 publications
0
1
0
Order By: Relevance
“…These images uncover the presence of creases, folds, or strata misalignments, which are effectively concealed within the film after the growth stage. (Parwani, Dubey, Dixit, & Kaurav, 2019). These characteristic peaks are typically detected at specific 2θ angles, offering valuable insights into the structural attributes of the film.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…These images uncover the presence of creases, folds, or strata misalignments, which are effectively concealed within the film after the growth stage. (Parwani, Dubey, Dixit, & Kaurav, 2019). These characteristic peaks are typically detected at specific 2θ angles, offering valuable insights into the structural attributes of the film.…”
Section: Resultsmentioning
confidence: 99%
“…Parwani et al synthesized Zn-doped ZnO samples and analyzed their structure using XRD. The changes observed in crystallinity and particle size were due to Zn dopin(Parwani, Dubey, Dixit, & Kaurav, 2019). These characteristic peaks are typically detected at specific 2θ angles, offering valuable insights into the structural attributes of the film.…”
mentioning
confidence: 99%
“…A few papers have concentrated on the synthesis and deposition of zinc-doped NiO thin layers. Additionally, doping with Zn ion can modify the band structure of NiO to affect its optoelectronic performance [17][18][19].…”
Section: Introductionmentioning
confidence: 99%