XRD Analysis of Plasma Sprayed YSZ-NiO-Ni Ceramic Coatings

Abstract

The present work aims to determine the phase composition of multi‐phase yttria‐stabilized zirconia, nickel oxide, nickel (YSZ‐NiO‐Ni) coatings using X‐ray diffraction (XRD) analysis. The ceramic layers were fabricated onto the stainless steel and Al2O3 substrates by vacuum plasma spray technique. The known mass ratio of YSZ, NiO, Ni powder mixtures were prepared carefully for the XRD analysis. An analytical software involving background elimination, the split‐Pearson VII peak approximation, was used for the peak intensity and area calculations. The relative XRD peak areas of the powder mixtures were compared with those of the corresponding coatings. Comparison of peaks and mass balance equation allowed to eliminate the influence of the absorption factor and to estimate the phase composition of YSZ, NiO, and Ni in the coatings. The concentration of phases was calculated with a relative error of less than 5%.

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“…33 The area of diffraction peak in the XRD pattern is proportional to the corresponding content. 34 And the content ratios of different planes in β-MnO 2 calculated below are based on this: 18.4% (110) plane, 33.0% (101) plane, 16.3% (111) plane and 32.3% (211) plane. The pattern of AMO shows no obvious diffraction peak which indicates it owns an amorphous structure.…”

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“…The XRD patterns of 2.5 wt % Ni-ZSM5 samples are shown in Figure . For comparison, XRD patterns of pure NiO nanoparticles − and pure H-ZSM5 , were collected and are included in Figure a,b, respectively. It clearly shows that the XRD of 2.5 wt % Ni-ZSM5 without filtration (Figure c) has the (200) diffraction peak of NiO, though the (111) diffraction peak of NiO (marked with a blue arrow) overlapped with peaks of the ZSM5.…”