2018
DOI: 10.1016/j.apsusc.2018.04.077
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XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

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Cited by 173 publications
(103 citation statements)
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“…The six most prominent peaks of these spectra are attributable to Ce 4+ ions. 33 This indicates that Ce 4+ was the dominant cerium species in all three samples. The peak ttings (dashed lines) in panels G, H and I are based on the method by Maslakov et al.…”
mentioning
confidence: 74%
See 1 more Smart Citation
“…The six most prominent peaks of these spectra are attributable to Ce 4+ ions. 33 This indicates that Ce 4+ was the dominant cerium species in all three samples. The peak ttings (dashed lines) in panels G, H and I are based on the method by Maslakov et al.…”
mentioning
confidence: 74%
“…The peak ttings (dashed lines) in panels G, H and I are based on the method by Maslakov et al. 33 The tting based deconvolution of Ce 3d XPS spectra indicates that the concentration of surface Ce 3+ in all these samples is <3%. Such a low abundance of surface Ce 3+ is also supported by the absence of a shoulder peak of Ce 4f electrons at $1.1 eV in the XPS valence band spectrum of the CeNRs samples ( Fig.…”
mentioning
confidence: 96%
“…2). The Ce 3d peak at 877.8 eV can be assigned to Ce 4+ [45][46][47]. The observed Ce 3d peak was really weak, showing very few loading amounts of Ce ions.…”
Section: Characterizationmentioning
confidence: 94%
“…6 X-ray photoelectron spectroscopy (XPS) has been widely used for the study of the electronic structure of CeO 2 . [7][8][9][10][11] The core and valence XPS spectra of cerium compounds are complicated and structured. This complicates the determination of the oxidation state of cerium on the basis of chemical shifts.…”
Section: Introductionmentioning
confidence: 99%