1991
DOI: 10.1016/0039-6028(91)91099-j
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XPS study of Al/polyethylene terephtalate interface

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Cited by 23 publications
(7 citation statements)
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“…The broader, higher energy peaks were indicative of oxidized Al, whereas the lower energy peaks were consistent with the presence of Al metal . The differences in binding energies of 2.5−2.8 eV for these species were intermediate between the differences for Al and AlF 3 (Δ = 3.4 eV), AlCl 3 (Δ = 1.8 eV), Al(OH) 3 (Δ = 1.1, 1.3 eV), and Al 2 O 3 (Δ = 0.8−1.5 eV), and were close to that of 2.6 eV proposed for AlOF and Al in the thermal deposition of Al on fluorinated poly(ethylene terephthalate) …”
Section: Discussionsupporting
confidence: 49%
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“…The broader, higher energy peaks were indicative of oxidized Al, whereas the lower energy peaks were consistent with the presence of Al metal . The differences in binding energies of 2.5−2.8 eV for these species were intermediate between the differences for Al and AlF 3 (Δ = 3.4 eV), AlCl 3 (Δ = 1.8 eV), Al(OH) 3 (Δ = 1.1, 1.3 eV), and Al 2 O 3 (Δ = 0.8−1.5 eV), and were close to that of 2.6 eV proposed for AlOF and Al in the thermal deposition of Al on fluorinated poly(ethylene terephthalate) …”
Section: Discussionsupporting
confidence: 49%
“…36 The differences in binding energies of 2.5-2.8 eV for these species were intermediate between the differences for Al and AlF 3 (∆ ) 3.4 eV), AlCl 3 (∆ ) 1.8 eV), Al(OH) 3 (∆ ) 1.1, 1.3 eV), and Al 2 O 3 (∆ ) 0.8-1.5 eV), 36 and were close to that of 2.6 eV proposed for AlOF and Al in the thermal deposition of Al on fluorinated poly(ethylene terephthalate). 46 The role that TiCl 4 played in the deposition process was unclear. There was visible and XPS evidence for Al deposition on surfaces treated with TiCl 4 and DMEAA; there was no evidence of Al on clean surfaces treated only with DMEAA.…”
Section: Resultsmentioning
confidence: 99%
“…Interfacial properties are generally divided into structural, chemical, and mechanical aspects, whereby all three are naturally related. For metal‐polymer composites, most frequent methods to study interface chemistry and structure are ex situ or in situ X‐ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM) because of high surface sensitivity and resolution at small length scales, respectively. Relating chemical and structural aspects to mechanical adhesion (peel test, tensile‐induced delamination) allows to identify favorable interfacial conditions.…”
Section: Introductionmentioning
confidence: 99%
“…The C 1s signal at the lowest energy peak at 285 eV is attributed to adventitious C−H species. The C 1s middle energy peak with a binding energy of ∼286.5 eV is attributed to C−O species. ,– , Both of these peaks are expected in the alucone MLD films.…”
Section: Resultsmentioning
confidence: 98%