XPS, Raman spectroscopy, X‐ray diffraction, specular X‐ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization

Ermolieff, A.; Chabli, Amal; Pierre, F.; Rolland, G.; Rouchon, D.; Vannuffel, C.; Vergnaud, C.; Baylet, J.; Séméria, M. N.

doi:10.1002/sia.955

Cited by 62 publications

(35 citation statements)

References 13 publications

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“…Similar to previous studies [14,16], 284.7 ± 0.2 and 285.6 ± 0.2 eV components in C1 s spectra are attributed to sp 2 and sp 3 bonds [22], namely, sp 2 hybridization of carbon atoms and sp 3 hybridization of C-C or C-H bonds, respectively [23]. The fitting results show that the fraction of the sp 2 bond is more than 80%, confirming the NCG formation on MgF 2 .…”

Section: Resultssupporting

confidence: 89%

Graphitic carbon grown on fluorides by molecular beam epitaxy

et al. 2013

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We study the growth mechanism of carbon molecules supplied by molecular beam epitaxy on fluoride substrates (MgF2, CaF2, and BaF2). All the carbon layers form graphitic carbon with different crystallinities depending on the cation. Especially, the growth on MgF2 results in the formation of nanocrystalline graphite (NCG). Such dependence on the cation is a new observation and calls for further systematic studies with other series of substrates. At the same growth temperature, the NCG on MgF2 has larger clusters than those on oxides. This is contrary to the general expectation because the bond strength of the carbon-fluorine bond is larger than that of the carbon-oxygen bond. Our results show that the growth of graphitic carbon does not simply depend on the chemical bonding between the carbon and the anion in the substrate.

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Section: Resultssupporting

confidence: 89%

Graphitic carbon grown on fluorides by molecular beam epitaxy

et al. 2013

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“…It also indicates that the film is composed of mostly carbon with traces of O and N. Chemical nature of the carbon is analyzed using curve fitting procedure ( figure 6, left). It shows that film is mostly composed of sp 2 carbon bonded to other sp 2 carbon with less quantity of sp 3 carbon bonded to other sp 3 carbon [29]. It also shows that some quantity of carbon is attached to O as well as to N. This fact is also supported by the characteristic peak for O and N in the XPS spectrum.…”

Section: Characterization Of Deposited Filmmentioning

confidence: 68%

Amorphous carbon film deposition on the inner surface of tubes using atmospheric pressure pulsed filamentary plasma source

Pothiraja¹,

Bibinov²,

Awakowicz³

2011

J. Phys. D: Appl. Phys.

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Uniform amorphous carbon film is deposited on the inner surface of quartz tube having the inner diameter of 6 mm and the outer diameter of 8 mm. A pulsed filamentary plasma source is used for the deposition. Long plasma filaments (~ 140 mm) as a positive filamentary discharge are generated inside the tube in argon with methane admixture. FTIR-ATR, XRD, SEM, LSM and XPS analyses give the conclusion that deposited film is amorphous composed of non-hydrogenated sp 2 carbon and hydrogenated sp 3 carbon. Plasma is characterized using optical emission spectroscopy, voltage-current measurement, microphotography and numerical simulation. On the basis of observed plasma parameters, the kinetics of the film deposition process is discussed.

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“…The C 1s spectrum contained three components. The 285.2 eV peak was signed to graphite of the sp 2 -hybridized carbon, whereas the 286.7 eV peak was attributed to C-O bond [26,27]. The small peak around 289.2 eV was also observed on ZnO samples, which could be attributed to carboxyl-containing contamination, but it may be from the adsorbed atmospheric CO 2 .…”

Section: Characterizations Of Ag Modified C-zno Nanocrystalsmentioning

confidence: 72%