XPS investigation of the a-C : H/Al interface

Deposition and characterization of ternary thin films within the Ti–Al–C system by DC magnetron sputtering

“…11c, the peak of Al(2p) is shifted towards higher binding energies and broadened with an increasing C content, i. [48]. The shift is consistent with an increase in Al-C bond character in the compound.…”

“…A small shift, however, towards higher binding energies can be seen for the Al-containing films. This shift is induced by Al-C interactions and the position can be compared with the C(1s) peak in Al 4 C 3 at 282.2 eV [48]. As can be seen in Fig.…”

Diamond-like carbon coatings on a CoCrMo implant alloy: A detailed XPS analysis of the chemical states at the interface

“…Using argon ion sputtering, one easily obtains the elemental compositions vs larger depth [10], but accepting that the true interface configuration possibly gets modified. In the literature, a few XPS studies of the interface of a-C:H on different substrates have been published [8,[11][12][13][14]. This study presents the results for the interface of DLC films on wrought CoCrMo alloy substrates without and with a cobalt or chromium interlayer.…”

Reactivity enhancement of oxide skins in reversible Ti-doped NaAlH4

“…During decomposition, metallic Al is formed by both reactions (1) and (2). The corresponding chemical shift is high enough to be distinguished by XPS and a second peak develops during decomposition, indicative of metallic aluminium (72.8 eV, 35 compare also with Ref. 36).…”