XPS and SR-XPS techniques applied to sulphide mineral surfaces

Laajalehto, K.; Kartio, I.; Suoninen, E.

doi:10.1016/s0301-7516(97)00029-x

Cited by 72 publications

(30 citation statements)

References 10 publications

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“…The synchrotron radiation source of XPS provides a continuous energy distribution over large energy region with high intensity and tuneability giving an optimal excitation energy instead of a fixed excitation energy source (either AlK α or MgK α radiation from a sealed-off X-ray tube) used in conventional XPS [18,19]. The photon energies of synchrotron source can be varied to various escape depth of out coming photon electrons and having a better photon ionization cross-section [20].…”

Section: Synchrotron Radiation Xps Studymentioning

confidence: 99%

Solar absorptance of copper–cobalt oxide thin film coatings with nano-size, grain-like morphology: Optimization and synchrotron radiation XPS studies

Amri

Duan

Yin

et al. 2013

Applied Surface Science

176

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Copper-cobalt oxides thin films had been successfully coated on reflective aluminium substrates via a facile sol-gel dip-coating method for solar absorptance study. The optimum absorptance in the range of solar radiation is needed for further optimum design of this material for selective solar absorber application. Field emission scanning electron microscopy was used to characterize the surface morphology of the coating whereby nano-size, grain-like morphology was observed.Synchrotron with dip-speed 120 mm/min (four cycles). The operational simplicity of the dip-coating system indicated that it could be extended for coating of other mixed metal oxides as well.

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Section: Synchrotron Radiation Xps Studymentioning

confidence: 99%

Solar absorptance of copper–cobalt oxide thin film coatings with nano-size, grain-like morphology: Optimization and synchrotron radiation XPS studies

Amri

Duan

Yin

et al. 2013

Applied Surface Science

176

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“…There have been a number of recent experimental studies of the bulk and surfaces of iron pyrite using a wide range of techniques including X-ray photoelectron spectroscopy (XPS) [10,11], low energy electron diffraction (LEED), ultraviolet photoelectron spectroscopy (UPS) and scanning-tunneling microscopy (STM) [12], inverse ultraviolet photoemission spectroscopy [13,14], X-ray adsorption [15], and X-ray emission spectroscopy [16]. The measured values for the energy band gap vary in a broad range from 0.7 eV to 2.62 eV.…”

mentioning

confidence: 99%

Electronic structure, optical and X‐ray emission spectra in FeS₂

Antonov

Germash

Shpak

et al. 2009

Physica Status Solidi (b)

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The electronic structure, optical spectra, X‐ray emission (XE) and X‐ray absorption (XA) spectra of FeS2 were investigated theoretically from first principles, using the fully relativistic Dirac LMTO band structure method in local density approximation (LDA). Theory produces correct semiconductor ground state in FeS2 with the energy gap of Eg = 0.9 eV in good agreement with the experimental data. Densities of valence states are analyzed and discussed. The origin of the optical, XA and XE spectra in the FeS2 compound is examined. The calculated results are compared with available experimental data. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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“…In order to illustrate how XAFS effects might influence an XPS analysis based on a synchrotron radiation source, two examples will be drawn from a recent study of the oxidation of sulphide mineral surfaces (PbS, FeS 2 by Laajalehto, Kartio and Suoninen (LKS). 12 Synchrotron radiation is attractive for XPS studies of mineral surfaces because the ability to vary the photon energy permits modifications of the information depth of the analysis. References 12 -16 describe some further applications of this method.…”

Section: Resultsmentioning

confidence: 99%

Consequences of x‐ray absorption fine structure for quantitative core‐level photoelectron spectroscopy

Karolewski

2003

Surface & Interface Analysis

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The dependence of x-ray absorption fine structure (XAFS) on the chemical environment implies a corresponding environmental dependence of photoionization cross-sections. The practical consequences of the XAFS for quantitative core-level photoelectron spectroscopy have been studied for a number of materials with the help of simulations based on the ab initio FEFF code. The XAFS effects are predicted to be significant only for photoelectron kinetic energies below 250-300 eV. These effects take the form of systematic sensitivity factor variations between different chemical structural environments (e.g. compound materials quantified with reference to elemental standards). Apart from a few exceptions (e.g. the 2p core levels of Zn, Ga, Ge and As in metallic environments), the XAFS should introduce no significant errors when conventional Mg Ka or Al Ka sources are used for excitation. For core-level spectra excited with synchrotron radiation or He II radiation sources, the quantification errors can readily approach or exceed 10% at room temperature (and are expected to increase at lower temperatures).

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XPS and SR-XPS techniques applied to sulphide mineral surfaces

Cited by 72 publications

References 10 publications

Solar absorptance of copper–cobalt oxide thin film coatings with nano-size, grain-like morphology: Optimization and synchrotron radiation XPS studies

Solar absorptance of copper–cobalt oxide thin film coatings with nano-size, grain-like morphology: Optimization and synchrotron radiation XPS studies

Electronic structure, optical and X‐ray emission spectra in FeS₂

Consequences of x‐ray absorption fine structure for quantitative core‐level photoelectron spectroscopy

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XPS and SR-XPS techniques applied to sulphide mineral surfaces

Cited by 72 publications

References 10 publications

Solar absorptance of copper–cobalt oxide thin film coatings with nano-size, grain-like morphology: Optimization and synchrotron radiation XPS studies

Solar absorptance of copper–cobalt oxide thin film coatings with nano-size, grain-like morphology: Optimization and synchrotron radiation XPS studies

Electronic structure, optical and X‐ray emission spectra in FeS2

Consequences of x‐ray absorption fine structure for quantitative core‐level photoelectron spectroscopy

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Product

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Electronic structure, optical and X‐ray emission spectra in FeS₂