2009
DOI: 10.2174/1876503300902010114
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XPS Analysis of Passive Film on Stainless Steel

Abstract: Potentiodynamic, impedance measurements were carried out on 304 stainless steel in 0.5N, 1.0, 2.0 and 5.0 N H 2 SO 4 solutions. X-ray photoelectron spectroscopic [XPS] The passive film found to contain chromium oxide inner layer and the dissolution of iron through it caused the formation of oxides of iron namely -Fe 2 O 3 and -FeOOH. Higher oxides of manganese and nickel are also due to dissolution through the film. Sulphates are reduced to sulphur chemically by the released protons from anodic polarization.

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Cited by 40 publications
(14 citation statements)
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“…The peaks related to Cr 2p3 electron level were identified to be Cr 2 O 3 at 576.34 eV and NiCr 2 O 4 at 577.4 eV. The results obtained by XPS analysis are in agreement with those obtained by SEM analysis and with those obtained by other researchers[14,15].…”
supporting
confidence: 90%
“…The peaks related to Cr 2p3 electron level were identified to be Cr 2 O 3 at 576.34 eV and NiCr 2 O 4 at 577.4 eV. The results obtained by XPS analysis are in agreement with those obtained by SEM analysis and with those obtained by other researchers[14,15].…”
supporting
confidence: 90%
“…Moreover, the coherent peaks of O 1s at 531 eV for SS‐TNL also signify that the surface is composed of a titanium oxide layer. Similar peaks observed on unmodified SS correspond to the metallic oxides and hydroxides of chromium and iron, respectively …”
Section: Resultsmentioning
confidence: 99%
“…3(a) reveals that the surface of the Ni coating contained Ni species deconvoluted at 856.7 eV (most enriched), 857.7 eV and 858.6 eV (least enriched), with corresponding O 1s peaks at 532.4 eV and 533.5 eV. The binding energy at 856.7 eV is consistent with the formation of Ni(OH)2 [11,12,[19][20][21]. Although higher binding energies are commonly correlated with higher oxidation state species, the phenomenon for a Ni oxidation to Ni +3 was not observed during the polarization experiments.…”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 73%