XPCS at the European X-ray free electron laser facility

Grübel, G.; Stephenson, G. B.; Gutt, Christian; Sinn, H.; Tschentscher, Th.

doi:10.1016/j.nimb.2007.05.015

Cited by 108 publications

(89 citation statements)

References 33 publications

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“…Known as X-ray photon correlation spectroscopy 16,17 (XPCS), a range of applications for this technique using FEL sources have recently been proposed 18 . Here, XPCS correlation functions comparing the diffraction pattern at t ¼ 0 with subsequent diffraction patterns (Fig.…”

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confidence: 99%

Ultrafast single-shot diffraction imaging of nanoscale dynamics

et al. 2008

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The transient nanoscale dynamics of materials on femtosecond to picosecond timescales is of great interest in the study of condensed phase dynamics such as crack formation, phase separation and nucleation, and rapid fluctuations in the liquid state or in biologically relevant environments. The ability to take images in a single shot is the key to studying non-repetitive behaviour mechanisms, a capability that is of great importance in many of these problems. Using coherent diffraction imaging with femtosecond X-ray free-electron-laser pulses we capture time-series snapshots of a solid as it evolves on the ultrafast timescale. Artificial structures imprinted on a Si 3 N 4 window are excited with an optical laser and undergo laser ablation, which is imaged with a spatial resolution of 50 nm and a temporal resolution of 10 ps. By using the shortest available free-electronlaser wavelengths 1 and proven synchronization methods 2 this technique could be extended to spatial resolutions of a few nanometres and temporal resolutions of a few tens of femtoseconds. This experiment opens the door to a new regime of time-resolved experiments in mesoscopic dynamics.To date, optical pulses have made it possible to resolve dynamics on the femtosecond timescale, but the spatial resolution of these studies has been limited to a few micrometres 3 . On the other hand, femtosecond X-ray pulses have been used to detect Å ngstrom-scale atomic motions in extended crystalline materials with long-range order through time-resolved diffraction experiments 4,5 . An entirely different methodology is needed to investigate the ultrafast dynamics of non-crystalline materials at nanometre length scales. Applications at these scales can be found in the study of fracture dynamics, shock formation, spallation, ablation, and plasma formation under extreme conditions. In the solid state it is desirable to directly image dynamic processes such as nucleation and phase growth, phase fluctuations and various forms of electronic or magnetic segregation.Electron microscopes can provide nanometre to atomic resolution, and have recently been demonstrated with ultrafast pulses 6 . However, they have limited penetrating power and struggle to obtain high-quality single-shot images due to space-charge issues 7 . Synchrotron beams from third-generation sources have comparatively long pulse lengths of 10-100 ps, as determined by the shortest electron bunch length possible in a given storage ring. Synchrotron sources can produce short-pulse ($100 fs) X-rays when operated as femtosecond slicing sources 8 , but produce comparatively weak X-ray beams of 1 Â 10 7 photons per second. Along with X-ray pulses from femtosecond laser plasma sources 9,10 and high-harmonic-generation sources 11 this limits their use to non-destructive phenomena where weak signals can be accumulated over many repeatable excitations of the sample.The intense femtosecond X-ray pulses from free-electron-laser (FEL) sources provide the penetrating power, spatial resolution and single-shot imaging c...

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confidence: 99%

Ultrafast single-shot diffraction imaging of nanoscale dynamics

et al. 2008

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“…X-ray photon correlation spectroscopy (XPCS) is the application of dynamic light scattering in the x-ray regime 188 and utilizes the high coherence of the novel x-ray laser sources 189 Lawrie Skinner gained his PhD in physics from Bristol University studying novel aluminate glasses using neutron and synchrotron x-ray scattering under the supervision of Dr Adrian Barnes. He then applied these pair distribution function techniques to cementitious materials as a postdoctoral associate at UC Berkeley.…”

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confidence: 99%

X-ray and Neutron Scattering of Water

et al. 2016

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International audienceThis review article focuses on the most recent advances in X-ray and neutron scattering studies of water structure, from ambient temperature to the deeply supercooled and amorphous states, and of water diffusive and collective dynamics, in disparate thermodynamic conditions and environments. In particular, the ability to measure X-ray and neutron diffraction of water with unprecedented high accuracy in an extended range of momentum transfers has allowed the derivation of detailed O–O pair correlation functions. A panorama of the diffusive dynamics of water in a wide range of temperatures (from 400 K down to supercooled water) and pressures (from ambient up to multiple gigapascals) is presented. The recent results obtained by quasi-elastic neutron scattering under high pressure are compared with the existing data from nuclear magnetic resonance, dielectric and infrared measurements, and modeling. A detailed description of the vibrational dynamics of water as measured by inelastic neutron scattering is presented. The dependence of the water vibrational density of states on temperature and pressure, and in the presence of biological molecules, is discussed. Results about the collective dynamics of water and its dispersion curves as measured by coherent inelastic neutron scattering and inelastic X-ray scattering in different thermodynamic conditions are reported

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“…For XPCS, two methods using XFEL are proposed: ''sequential technique'' and ''split-pulse technique''. [70][71][72][73] The sequential technique is basically same as a conventional XPCS, in which a sequence of speckle patterns obtained from each single shot is collected and autocorrelation functions are obtained. Relatively slow dynamics (less than rate of pulses) is measured by the sequential technique.…”

Section: Perspective Of Xpcsmentioning

confidence: 99%

Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation

et al. 2013

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In the present review, we focus on the characterization of polymer brushes by quantum beam, which is regarded as a promising probe of surface and interface analysis. The polymer brushes were prepared on various shapes of surface, and proved to be benefit to various applications. Among them, the polymer brushes grafted on sphere nanoparticles and flat substrates are investigated as representative cases. The static structure of polymer brushes, especially the chain dimension of polymer brushes grafted on nanoparticles and a flat substrate, have been studied by small angle X-ray scattering (SAXS) and neutron reflectivity (NR), respectively. The microscopic dynamical properties of polymer brushes are also expected to be revealed by quantum beam. X-ray photon correlation spectroscopy (XPCS), a technique using a coherent X-ray, is one of the promising methods for microscopically understanding of dynamical properties of polymer brushes. Some of our recent studies about dynamical behavior of polymer brush immobilized nanoparticle by XPCS are also presented.

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XPCS at the European X-ray free electron laser facility

Cited by 108 publications

References 33 publications

Ultrafast single-shot diffraction imaging of nanoscale dynamics

Ultrafast single-shot diffraction imaging of nanoscale dynamics

X-ray and Neutron Scattering of Water

Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation

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