X-ray wavefront characterization with grating  interferometry using an x-ray microfocus laboratory source

Zhao, Siwen; Wang, Keyi; Cheng, Guangyu; Shen, Y. R.; Wang, Yushan; Zhang, Lei

doi:10.1117/12.2576152

Advances in Metrology for X-Ray and EUV Optics IX 2020

DOI: 10.1117/12.2576152

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X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source

Siwen Zhao

Keyi Wang

Guangyu Cheng

et al.

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X-ray wavefront characterization with grating interferometry using an x-ray microfocus laboratory source

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