X-Ray Topographic Studies of Magnetic Domain Configurations and Movements

Polcarová, M.; Lang, A. R.

doi:10.1063/1.1777351

Cited by 101 publications

(12 citation statements)

References 3 publications

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“…X-ray diffraction topography has been used by many authors for investigation of magnetic domain structures. It has been shown that the magnetostrictive deformation is the reason of the visibility of domains (Polcarová & Lang 1962). The contrast appears due to variation of distortion at the domain walls.…”

Section: Introductionmentioning

confidence: 99%

X-ray topographic observation of magnetic domain structures induced by stresses

Polcarová

Brádler

Tomáš

et al. 1999

Philosophical Transactions of the Royal Society of London. Seri

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Section: Introductionmentioning

confidence: 99%

X-ray topographic observation of magnetic domain structures induced by stresses

Polcarová

Brádler

Tomáš

et al. 1999

Philosophical Transactions of the Royal Society of London. Seri

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“…The earliest X-ray topographic studies of internal magnetic domain structures in iron-silicon alloy single crystals were carried out on plates in either ( 110) or ( 112) orientations, the diffraction contrast being generated by strains associated with 90° domain wall boundaries. The high density of such boundaries in (112)-orientation plates provided the patterns rich in detail that were chosen to illustrate the ability of this non-contacting technique to image domains and record their movements (Polcarova & Lang 1962). In the areas concerned the Bitter patterns showed domain subdivision down to a scale of about 1 pm, whereas the X-ray topographic images contained contrast components corresponding to the interior laminated structures and had periods in the 10 to 15 pm range.…”

Section: Introductionmentioning

confidence: 99%

On magnetic domain configurations in single-crystal, (112)-orientation plates of iron-silicon alloy: some X-ray topographic observations and their interpretation

Frank

Kaczér

Lang

et al. 1993

Proc. R. Soc. Lond. A

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Possible magnetization states of a cubic ferromagnetic crystal having easy magnetization directions parallel to the cube axes (as in Fe + 3 mass % Si alloy) can be represented using a regular octahedron, as first shown by Néel. This model is developed to derive rules that govern shapes and relative volumes of the differently magnetized domains needed to produce mean magnetization lying in a plane of any orientation. Single-crystal plates of Fe + 3 mass % Si alloy not containing an easy-magnetization direction, such as plates parallel to (112) studied in this work, are in general subdivided into a hierarchy of domains that in spatial scale diminish from specimen interior towards specimen surfaces. X-ray topography offers a non-contacting method of mapping domain configurations. Under appropriate diffraction conditions the strains associated with 90° Bloch walls generate strong diffraction contrast. In X-ray transmission topographs the superimposition of contrast from surface closure domains upon that of inner domains generally gives rise to highly complex images from (112) plates. However, with specimen thicknesses less than 20 μm the patterns can become sufficiently simplified to make possible the identification of shapes and magnetization axes of all domains present. A pattern in this class is illustrated, and interpreted with the aid of the octahedron. Reasonable agreement is found between the observed size scale of the domains and that calculated for minimum energy in the domain structure proposed.

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“…The Kerr magneto-optical method, which is the most popular technique for domain studies [ll], requires a very careful specimen surface treatment: the specimen surface must be polished t'o an optically flat state without introducing any residual strain [ 121. On t'he other hand, the X-ray topographical method [13] can, in principle, be used to observe the domains on rough or coated surfaces. However, perfect single crystals have exclusively been observed with the X-ray method.…”

Section: Introductionmentioning

confidence: 99%

Observed depths of magnetic domains in high-voltage scanning electron microscopy

Tsuno

Yamamoto

1976

Phys. Stat. Sol. (a)

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The increased electron penetration using a high voltage scanning electron microscope enables one to discern internal domains. The maximum material depth contributing to magnetic contrast and resolution of domains are experimentally determined at 50 to 200 kV. The results are compared with the electron trajectories already shown by the Monte Carlo calculation. Domains of SiFe having unusual surfaces, e.g., with deformation layer and with special coating, are observed. The depths observed of domains are also estimated.

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X-Ray Topographic Studies of Magnetic Domain Configurations and Movements

Cited by 101 publications

References 3 publications

X-ray topographic observation of magnetic domain structures induced by stresses

X-ray topographic observation of magnetic domain structures induced by stresses

On magnetic domain configurations in single-crystal, (112)-orientation plates of iron-silicon alloy: some X-ray topographic observations and their interpretation

Observed depths of magnetic domains in high-voltage scanning electron microscopy

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