1989
DOI: 10.1002/crat.2170241214
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X‐ray studies of thermal expansion and phase transitions in (NH4)2SbF5 crystals

Abstract: X‐ray diffraction studies of phase transitions in (NH4)2SbF3 single crystals have been made by using the Bond‐type diffractometer for high‐precision measurements of the unit‐cell dimensions in a function of temperature. The principal linear thermal expansion coefficients and the linear Eulerian strain tensor have been calculated in the temperature interval 110 – 298 K. The phase transition diagram was proposed and the sequence of the phases has been compared with the results of other experimental techniques (N… Show more

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Cited by 10 publications
(9 citation statements)
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“…3) resembles a diffused phase transition at Tc3 P:. 132 K. This behaviour is in qualitative agreement with temperature dependences of Cp [10] and dilatation [6] of APFA. The similarity of temperature dependences of d(δ∆)/dT and Cp is shown in Fig.…”
Section: Results and Conclusionsupporting
confidence: 84%
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“…3) resembles a diffused phase transition at Tc3 P:. 132 K. This behaviour is in qualitative agreement with temperature dependences of Cp [10] and dilatation [6] of APFA. The similarity of temperature dependences of d(δ∆)/dT and Cp is shown in Fig.…”
Section: Results and Conclusionsupporting
confidence: 84%
“…1.5 and 1 1.5 mm the average relative error of determination of double optical thickness variations is equal to 7 x 10-5 . Using dependence of δ∆/∆ = f(T) (obtained in this experiment) and temperature dependences of lattice constant [6] (obtained from Bond's method), the temperature changes of relative refractive indices δn/n of APFA were obtained according to the formula The used method is characterized by high temperature sensitivity. 350-380 interference extrema (number of points on plots) correspond to 110-310 K temperature range and 1.5 mm sample thickness.…”
Section: Methodsmentioning
confidence: 99%
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