X-ray-scattering information obtained from near-field speckle

Cerbino, Roberto; Peverini, Luca; Potenza, M. A. C.; Robert, Aymeric; Bösecke, P.; Giglio, M.

doi:10.1038/nphys837

Cited by 116 publications

(102 citation statements)

References 24 publications

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“…These coherent images are much like digitally reconstructed holograms, and as such one can numerically focus through the object 15 . However, when the depth of focus is small, which is the case for imaging near the wavelength diffraction limit, the out-of-focus features interfere and lead to high-contrast 'speckles' that dominate the image 21 . There are ways to avoid these: use an incoherent method such as forming an image from the X-ray fluorescence (selecting the atomic lines present before ionization, and hence damage, sets in), use a much shorter X-ray wavelength to obtain a projection image not dominated by diffraction, or create a stereo pair by recording images made at two orientations through the cell.…”

Section: Unique Objectsmentioning

confidence: 99%

X-ray imaging beyond the limits

Chapman¹

2009

Nature Mater

120

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Section: Unique Objectsmentioning

confidence: 99%

X-ray imaging beyond the limits

Chapman¹

2009

Nature Mater

120

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“…random contrast features (Goodman, 2006). As the distortion of this interference pattern in the near field region is solely dependent on the wavefront propagation (Cerbino et al, 2008;Gatti et al, 2008;Magatti et al, 2009), it is possible to deduce the wavefront state by numerical processing of the images (Berujon et al, 2012).…”

Section: Instrument Presentationmentioning

confidence: 99%

X-ray pulse wavefront metrology using speckle tracking

Berujon

Ziegler

Cloetens

2015

J Synchrotron Radiat

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An instrument allowing the quantitative analysis of X-ray pulsed wavefronts is presented and its processing method explained. The system relies on the X-ray speckle tracking principle to accurately measure the phase gradient of the X-ray beam from which beam optical aberrations can be deduced. The key component of this instrument, a semi-transparent scintillator emitting visible light while transmitting X-rays, allows simultaneous recording of two speckle images at two different propagation distances from the X-ray source. The speckle tracking procedure for a reference-less metrology mode is described with a detailed account on the advanced processing schemes used. A method to characterize and compensate for the imaging detector distortion, whose principle is also based on speckle, is included. The presented instrument is expected to find interest at synchrotrons and at the new X-ray free-electron laser sources under development worldwide where successful exploitation of beams relies on the availability of an accurate wavefront metrology.

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“…Speckle-based imaging relies on the sample-induced distortions of a near-field speckle pattern produced by a static random phase modulator (e.g. a piece of sandpaper or a biological filter membrane) [11]. The working principles of the method and the procedures to retrieve the image signals are described in detail in Refs.…”

Section: Introductionmentioning

confidence: 99%