2010
DOI: 10.1007/s00339-010-5749-2
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X-ray, scanning electron microscopy and electrical properties of synthetic fresnoite (Ba2TiSi2O8) ceramics

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Cited by 12 publications
(6 citation statements)
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“…This impurity phase peak at 2u = 26.378 and 31.498 may be due to the formation of BaTiO 3 and TiO 2 which is within 5% of the total error and coming within the error limit. The detailed X-ray analysis of the pure compound was reported in our earlier paper [25]. Further analysis reveals that there is no impurity peak for substituted compound (Ba 2 TiOSi 1.8 Ge 0.2 O 7 ) in Rietveld refined pattern.…”
Section: Resultsmentioning
confidence: 95%
“…This impurity phase peak at 2u = 26.378 and 31.498 may be due to the formation of BaTiO 3 and TiO 2 which is within 5% of the total error and coming within the error limit. The detailed X-ray analysis of the pure compound was reported in our earlier paper [25]. Further analysis reveals that there is no impurity peak for substituted compound (Ba 2 TiOSi 1.8 Ge 0.2 O 7 ) in Rietveld refined pattern.…”
Section: Resultsmentioning
confidence: 95%
“…A complete analysis of the bond lengths and bond angles are in progress and will be communicated separately. The detail description of the high activation energy value of the pure fresnoite compound has also been given on the basis of energy band model in our earlier paper 30 …”
Section: Resultsmentioning
confidence: 99%
“…When the Ge-ion is substituted in Si-site, the Si-O bond of high bond energy 452 kJ/mol breaks and makes a new bond Si-Ge of low bond energy 297 kJ/mol hence bond strength reduce and increases the conductivity of substituted compound. The detailed description of the high activation energy value of the pure fresnoite compound has been given on the basis of energy band model in our earlier paper [15]. Although there is a difference in conductivity of both samples, their small but finite conductivities have been taken into account to explain the ferroelectricity in the samples.…”
Section: Resultsmentioning
confidence: 99%