2016
DOI: 10.1016/j.nima.2016.08.029
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X-ray response of CdZnTe detectors grown by the vertical Bridgman technique: Energy, temperature and high flux effects

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Cited by 46 publications
(20 citation statements)
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“…Energy X-ray and gamma ray spectra were obtained with a standard analog pulse processing electronics: shaping amplifier (672, ORTEC, USA) with a shaping time constant of 1 μs and multichannel analyser (MCA-8000A, Amptek, USA). Further details of spectroscopic set-up are reported in previous works 11 .…”
Section: Methodsmentioning
confidence: 99%
“…Energy X-ray and gamma ray spectra were obtained with a standard analog pulse processing electronics: shaping amplifier (672, ORTEC, USA) with a shaping time constant of 1 μs and multichannel analyser (MCA-8000A, Amptek, USA). Further details of spectroscopic set-up are reported in previous works 11 .…”
Section: Methodsmentioning
confidence: 99%
“…In previously published articles using similar CdZnTe sensors [ 20 ] the values reported were in the range of the . However, these values were obtained with planar sensor and therefore no small pixel effect.…”
Section: Results and Discussionmentioning
confidence: 86%
“…CdZnTe grown at IMEM-CNR (Parma, Italy) by Boron oxide encapsulated vertical Bridgman technique has already demonstrated optimal performance, both with a single-pixel contact geometry [ 20 ] and sub-millimeter pixel geometry (500 and 250 pitch) [ 21 ]. The excellent spectroscopic performance of this material and the absence of radiation-induced polarization effects up to fluxes of photons motivated the decision to test CdZnTe grown at IMEM-CNR for synchrotron application.…”
Section: Introductionmentioning
confidence: 99%
“…This attempt is fundamental in every field where the relevant information may be concealed or distorted by non-ideal behavior of the measuring instrument, such as the one of room temperature semiconductor detectors (RTSD). RTSDs are largely employed today for medical and astrophysical applications [ 1 ], as well as for environmental monitoring [ 2 ] and for high flux applications [ 3 , 4 ]. The main source of distortion is related to those events of radiation interaction for which the total energy deposited is inferior to the real energy of the incoming photon.…”
Section: Introductionmentioning
confidence: 99%