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2022
DOI: 10.1107/s1600577522002053
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X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

Abstract: The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer eq… Show more

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Cited by 12 publications
(35 citation statements)
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“…The advantage of using this Cu inflection point is a "gap" distance that does not dependent on the Cu roughness. Minor deviations of the below-quoted value compared to previous reports [7,17] can be explained by the much shorter qz range available for fitting (between 0.4 -1.6 Å -1 ) in these preceding studies. Machine-Learning Potential.…”
Section: Methodscontrasting
confidence: 62%
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“…The advantage of using this Cu inflection point is a "gap" distance that does not dependent on the Cu roughness. Minor deviations of the below-quoted value compared to previous reports [7,17] can be explained by the much shorter qz range available for fitting (between 0.4 -1.6 Å -1 ) in these preceding studies. Machine-Learning Potential.…”
Section: Methodscontrasting
confidence: 62%
“…The XRR data from the curved liquid Cu surface were treated according to the method described recently in ref. [17] to eliminate the curvature's effect and extract the normalized reflectivity profiles. The resulting XRR curves were fitted using Refl1D software to a slab model consisting of one (in case of bare Cu) or three (in case of Cu covered with Gr) layers: a Cu substrate, a void, and a C monolayer.…”
Section: Discussionmentioning
confidence: 99%
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