X-ray photoemission study of the calcium/titanium dioxide interface

Demri, B.; Hage‐Ali, M.; Moritz, Michał; Kahn, J. L.; Muster, D.

doi:10.1016/s0169-4332(96)00576-4

Cited by 38 publications

(15 citation statements)

References 19 publications

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“…This value is in agreement with the binding energy reported for perovskites and TiO 2 . The separation between Ti2p 3/2 and Ti2p 1/2 peaks is *5.8 eV is approximately same with other reports [22][23][24]. The results obtained from XPS analysis confirm that the valences of Ba, Ti and O elements in BT thin film are ?2, ?4 and -2 respectively.…”

Section: Xps Studiessupporting

confidence: 89%

Thickness dependence of structural, optical and luminescence properties of BaTiO3 thin films prepared by RF magnetron sputtering

Maneeshya¹,

Anitha²,

Thomas³

et al. 2015

J Mater Sci: Mater Electron

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BaTiO 3 thin films were deposited onto quartz substrates by RF magnetron sputtering. X-ray diffraction pattern showed the formation of BT thin films with a tetragonal structure with orientations along (101) plane. Average crystallite size increased from 12.52 to 14.87 nm as the film thickness increased from 207 to 554 nm. With the increase in film thickness, the structural disorder decreases and the crystalline quality of the films gradually improved. The film exhibited good adherence to the substrate and are crack free. X-ray photoelectron spectroscopy revealed the presence of barium, titanium and oxygen in BT film. An average transmittance of [80 % was observed for all the films. This high transmittance BT films in the visible region is suitable for various electro-optic applications. The transmittance spectra showed high UV-shielding properties. Optical band gap was found to decrease from 4.55 to 3.70 eV with increase of film thickness, whereas the refractive index was found to increase. The refractive index of the BT films can be tuned between 2.11 and 2.21 at 550 nm. The real and imaginary dielectric constants with increase in film thickness were investigated. The low dissipation factor of BT thin films makes it a promising material for frequency agile applications. The emission spectra of BT thin films consist of near band edge excitonic UV emission and defect related emission in the visible range. The PL emission bands in UV and visible region of BT thin films make them suitable for electro-optic devices and light emitters.

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Section: Xps Studiessupporting

confidence: 89%

Thickness dependence of structural, optical and luminescence properties of BaTiO3 thin films prepared by RF magnetron sputtering

Maneeshya¹,

Anitha²,

Thomas³

et al. 2015

J Mater Sci: Mater Electron

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“…This electronic interaction can be observed by XPS measurements, where shoulder peaks at low BE in XPS Ti2p spectra appear due to the electron transfer from metal to surface Ti. The results have been found in many metal/TiO 2 interfaces [281][282][283][284][285][286].…”

Section: Tio 2 Surfacesmentioning

confidence: 64%

Interaction of nanostructured metal overlayers with oxide surfaces

Wagner

2007

Surface Science Reports

717

651

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“…This shift is a known effect of ion bombardment in oxide compounds containing titanium. So, if we take as an example the simplest case of TiO 2 , the values of the binding energy of the Ti 2p 3/2 core level measured earlier for the native oxide surface are 458.7, 12 458.9 13 and 458.8 eV.…”

Section: Resultsmentioning

confidence: 88%

Study of KTiOPO₄ surface by x‐ray photoelectron spectroscopy and reflection high‐energy electron diffraction

Atuchin

Kesler

Maklakova

et al. 2002

Surface & Interface Analysis

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Structural and electronic properties of the as-grown (011) crystal face and the mechanically polished (001) surface of potassium titanyl phosphate (KTiOPO 4 or KTP) have been investigated by core-level x-ray photoelectron spectroscopy and reflection high-energy electron diffraction (RHEED). With XPS analysis the original element binding energies, Auger parameters for K 2p 3/2 and P 2p core levels, relative element contents and valence band structure have been determined for both crystal cuts. A great depletion of O, K and P in the (011) face with respect to the (001) surface was discovered on comparison of element peak areas. The Ti 2p 3/2 peak areas were virtually the same for both cuts investigated. The relative element contents at the (001) surface were very close to the formal composition of KTiOPO 4 , so it is optimal to use the polished (001) KTP surface cleaned by ion bombardment and the Ti 2p 3/2 core level as standards for determination of the chemical composition of doped crystal surfaces.

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X-ray photoemission study of the calcium/titanium dioxide interface

Cited by 38 publications

References 19 publications

Thickness dependence of structural, optical and luminescence properties of BaTiO3 thin films prepared by RF magnetron sputtering

Thickness dependence of structural, optical and luminescence properties of BaTiO3 thin films prepared by RF magnetron sputtering

Interaction of nanostructured metal overlayers with oxide surfaces

Study of KTiOPO₄ surface by x‐ray photoelectron spectroscopy and reflection high‐energy electron diffraction

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X-ray photoemission study of the calcium/titanium dioxide interface

Cited by 38 publications

References 19 publications

Thickness dependence of structural, optical and luminescence properties of BaTiO3 thin films prepared by RF magnetron sputtering

Thickness dependence of structural, optical and luminescence properties of BaTiO3 thin films prepared by RF magnetron sputtering

Interaction of nanostructured metal overlayers with oxide surfaces

Study of KTiOPO4 surface by x‐ray photoelectron spectroscopy and reflection high‐energy electron diffraction

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Study of KTiOPO₄ surface by x‐ray photoelectron spectroscopy and reflection high‐energy electron diffraction