2000
DOI: 10.1016/s0925-9635(00)00345-9
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X-Ray photoelectron spectroscopy reference data for identification of the C3N4 phase in carbon–nitrogen films

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Cited by 476 publications
(294 citation statements)
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“…5 (d)) was decomposed into seven components at 284.4, 285.2, 285.7, 286.8, 287.9, 289.7 and 292.8 eV. These peak values are attributed to C _ C, C-C, C _ N, C`N(C-O), C-N, CO bonded network and π-excitation respectively and are similar with other reports [29,40,41]. The spectrum showed that the peak intensity for sp 3 bonded carbon (C-C) has reduced significantly.…”
Section: X-ray Photoelecron Spectroscopy (Xps) Studiessupporting
confidence: 87%
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“…5 (d)) was decomposed into seven components at 284.4, 285.2, 285.7, 286.8, 287.9, 289.7 and 292.8 eV. These peak values are attributed to C _ C, C-C, C _ N, C`N(C-O), C-N, CO bonded network and π-excitation respectively and are similar with other reports [29,40,41]. The spectrum showed that the peak intensity for sp 3 bonded carbon (C-C) has reduced significantly.…”
Section: X-ray Photoelecron Spectroscopy (Xps) Studiessupporting
confidence: 87%
“…It indicates that the surfaces of Si-DLC films are rich in sp 2 bonded carbon. Another peak at 292.7 eV was attributed to π-excitation, which appears in all carbon compounds having double bonds [27][28][29]. The Si 2p spectrum was deconvoluted into five components with a strong peak for Si-C (Si 1+) bond at 100.7 eV and two small peaks for Si 2 O 3 (Si 3+) and SiO 2 (Si 4+) type of binding at 102.3 eV and 103.4 eV respectively (the number in bracket denotes the oxidation state of Si).…”
Section: X-ray Photoelecron Spectroscopy (Xps) Studiesmentioning
confidence: 99%
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“…NC shows two distinct peaks at 400.9 eV and 398.9 eV. For HTMA-C, the peak at 399.8 eV corresponds to amine or cyano groups [38,50], while the smaller peak at 401.4 eV corresponds to quaternary nitrogen (N-Q) [22,25]. The significantly larger intensity of the peak at 399.8 eV suggests that most of the nitrogen found in this sample is in the form of surface funtionalities.…”
Section: Science China Materialsmentioning
confidence: 90%
“…Although PTFE was also used to prepare these samples, the fluorine peak intensity is too low to separate from the background noise in the spectra. Each of the 3 samples exhibits a strong C1s peak near 284.8 eV, which is typical for pure carbon [49,50]. Detailed scans for O1s peak and N1s peak are shown in Fig.…”
Section: Science China Materialsmentioning
confidence: 99%