2007
DOI: 10.1016/j.elspec.2006.11.059
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X-ray photoelectron investigation of carbon nanostructures in iron matrix

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Cited by 2 publications
(5 citation statements)
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“…Careful analysis of C 1 s spectrum in graphite indicates that it is a single peak, well described by an asymmetric Doniach‐Šunjic function . The situation of diamond is quite different: the literature data for BE of C 1 s peak are varying from about 284 eV to about 286 eV, what can be explained by the possible influence of sample charging due to the electrical insulation of this allotrope, especially if it is undoped. However, much more important are not the absolute BE values, but the chemical shift between graphite and diamond.…”
Section: Introductionmentioning
confidence: 89%
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“…Careful analysis of C 1 s spectrum in graphite indicates that it is a single peak, well described by an asymmetric Doniach‐Šunjic function . The situation of diamond is quite different: the literature data for BE of C 1 s peak are varying from about 284 eV to about 286 eV, what can be explained by the possible influence of sample charging due to the electrical insulation of this allotrope, especially if it is undoped. However, much more important are not the absolute BE values, but the chemical shift between graphite and diamond.…”
Section: Introductionmentioning
confidence: 89%
“…However, much more important are not the absolute BE values, but the chemical shift between graphite and diamond. The results of photoemission experiments and theoretical calculations of this shift give the values from 0–0.2 eV to relatively high values, varying between 0.7 and 1.5 eV . Again, the high scattering of these values can be explained by the effect of possible sample charging and/or by the presence of the BE shift between the surface and bulk of the diamond .…”
Section: Introductionmentioning
confidence: 99%
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“…However, Raman technique has a poor capability in quantitative analysis. XPS can be used to estimate the fraction of sp 2 ‐hybridised atoms in carbonaceous materials 8, 9…”
Section: Introductionmentioning
confidence: 99%
“…XPS can be used to estimate the fraction of sp 2 -hybridised atoms in carbonaceous materials. [8,9] XPS is a surface analytical technique which provides both chemical and binding information for a variety of materials. For carbon materials, the C 1s core energy level at around 280-290 eV, [10] the plasmon-loss energy at around 0-60 eV relative to C1s main peak [11] and the X-ray-excited Auger peaks at higher binding energy [11] all give phase information on the carbon present.…”
mentioning
confidence: 99%