X-ray optics development and metrology at Shanghai synchrotron radiation facility

Abstract

Modern third-generation synchrotron radiation sources provide more collimated, brighter, and coherent X-ray beams for experimental techniques. X-ray optics are the bridge between the light sources and the experimental stations. Any defect (either from mirrors or crystals) will bottleneck preventing the exploitation of the full characteristics of the source. In addition to high-quality X-ray optics, mirror mounting, and handling of thermal deformation are also of critical importance. Advanced metrology to properly exploit all the new potential of these optics is needed. Shanghai Synchrotron Radiation Facility (SSRF) has metrology labs equipped with visible-light-based measuring instruments and X-ray test beamline for in-situ metrology. In this article, we will present the current state of the art of mirrors, crystals, and diagnostics at SSRF.