X-ray nanobeam diffraction imaging of materials

Schülli, Tobias U.; Leake, Steven

doi:10.1016/j.cossms.2018.09.003

Cited by 43 publications

(29 citation statements)

References 121 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Operating at a spatial resolution of tens of nanometres, and focusing on an individual crystal, nanoscanning and coherent X-ray diffraction techniques (Coherent Bragg Diffraction Imaging, CBDI) are capable of mapping the strain component along a scattering vector in single crystals (see (Schulli & Leake, 2018) [42] for a recent review). Mapping several reflections in an isolated nano-crystal (Newton et al, 2010) [43] or in embedded grains (Cherukara et al, 2018) [44] enables quantification of the full strain tensor and has recently been used to characterise the full 3D strain tensor field around individual dislocations (Hofmann et al, 2020) [45].…”

Section: Intragranular Strain (Type III Stresses)mentioning

confidence: 99%

Three-dimensional reconstruction of intragranular strain and orientation in polycrystals by near-field X-ray diffraction

Reischig

Ludwig

2020

Current Opinion in Solid State and Materials Science

View full text Add to dashboard Cite

A theoretical framework is proposed for simultaneous reconstruction of the three-dimensional grain shapes, intragranular strain and orientation fields inside polycrystals from near-field X-ray diffraction images, using box beam illumination. The approach, named Iterative Tensor Field (ITF) reconstruction, uses a tensor field representation and a kinematical forward simulation model to reproduce the measured diffraction signal from individual grains. The framework establishes a link between the local deformation components inside the grains and the intensities of the diffraction signal in the measured images by forming a local linear problem. This is solved using a large scale linear optimisation method in every main iteration of the underlying non-linear problem. The optimisation enforces smooth gradients and the objective function may include regularisation constraints of static equilibrium or input from a Crystal Plasticity FEM simulation. The method has modest computational requirements and enables efficient scanning of millimetre or sub-millimetre sized specimens. Results on experimental data measured on a Gum metal specimen are presented, which demonstrate convergence and the feasibility of the approach. The mathematical formulation, data representation and challenges in the reconstruction and validation are discussed. The physical aspects of the contrast phenomenon, the deformation sensitivity of the technique, and potential means of error assessment are described. A number of alternative concepts for a polycrystalline deformation model and potential solvers are also presented.

show abstract

Section: Intragranular Strain (Type III Stresses)mentioning

confidence: 99%

Three-dimensional reconstruction of intragranular strain and orientation in polycrystals by near-field X-ray diffraction

Reischig

Ludwig

2020

Current Opinion in Solid State and Materials Science

View full text Add to dashboard Cite

show abstract

“…Nowadays, thanks to the advanced features of the latest generation synchrotron sources and new X-ray optics [29][30][31][32][33][34], new techniques have been developed for this purpose. Scanning Xray (sub)micro-diffraction (SµXRD) and spectroscopy, e.g., scanning micro X-ray absorption (SµXAS) and scanning micro X-ray fluorescence (SµXRF), constitute an optimal approach [35] to investigate structure fluctuations in several systems like perovskite materials such as La2CuO4+y [36][37][38][39][40][41][42][43], YBa2Cu3O6.5 [44][45][46][47], K0.8Fe1.6Se2 [48][49][50]. Electronic fluctuations such as short-range Charge Density Waves (CDW) have been detected by resonant X-ray scattering [51][52][53][54][55][56] probing the average structure and by SµXRD [40,[57][58][59][60] probing the spatial distribution of electronic nanometric patches.…”

Section: Introductionmentioning

confidence: 99%

Evolution of Complexity in Out-of-Equilibrium Systems by Time-Resolved or Space-Resolved Synchrotron Radiation Techniques

Campi

Bianconi

2019

Condensed Matter

View full text Add to dashboard Cite

Out-of-equilibrium phenomena are attracting high interest in physics, materials science, chemistry and life sciences. In this state, the study of structural fluctuations at different length scales in time and space are necessary to achieve significant advances in the understanding of the structure-functionality relationship. The visualization of patterns arising from spatiotemporal fluctuations is nowadays possible thanks to new advances in Xray instrumentation development that combine high-resolution both in space and in time. We present novel experimental approaches using high brilliance synchrotron radiation sources, fast detectors and focusing optics, joint with advanced data analysis based on automated statistical, mathematical and imaging processing tools. This approach has been used to investigate structural fluctuations in out-of-equilibrium systems in the novel field of inhomogeneous quantum complex matter at the crossing point of technology, physics and biology. In particular, we discuss how nanoscale complexity controls the emergence of hightemperature superconductivity (HTS), myelin functionality and formation of hybrid organicinorganic supramolecular assembly. The emergent complex geometries, opening novel venues to quantum technology and to the development of quantum physics of living systems, are discussed.

show abstract

“…two-dimensional MAXIPIX (ESRF, Grenoble, France) detector with a pixel size of 55 × 55 µm 2 , which was mounted 1260 mm downstream from the sample position. Further details of the experimental setup and the X-ray beam focusing at the ID01 beamline can be found in [26,27]. Prior to in situ three-point bending tests, the SFINX-tip and the nanofocused X-ray beam were aligned with respect to a pre-selected Au nanowire by optical microscopy, rendering a precision of a few micrometers followed by AFM imaging and scanning X-ray diffraction mapping using the K-mapping approach available at the ID01 beamline where the sample is continuously scanned through the beam and the diffraction yield at a selected Bragg peak is monitored [10].…”

Section: Resultsmentioning

confidence: 99%

“…The diffracted signal was recorded by a two-dimensional MAXIPIX (ESRF, Grenoble, France) detector with a pixel size of 55 × 55 µm 2 , which was mounted 1260 mm downstream from the sample position. Further details of the experimental setup and the X-ray beam focusing at the ID01 beamline can be found in [26,27].…”

Section: Methodsmentioning

confidence: 99%

In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Davydok

Cornelius

Ren

et al. 2018

QuBS

View full text Add to dashboard Cite

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

show abstract

X-ray nanobeam diffraction imaging of materials

Cited by 43 publications

References 121 publications

Three-dimensional reconstruction of intragranular strain and orientation in polycrystals by near-field X-ray diffraction

Three-dimensional reconstruction of intragranular strain and orientation in polycrystals by near-field X-ray diffraction

Evolution of Complexity in Out-of-Equilibrium Systems by Time-Resolved or Space-Resolved Synchrotron Radiation Techniques

In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Contact Info

Product

Resources

About