X-ray multimodal imaging using a random-phase object

Berujon, Sébastien; Wang, Hongchang; Sawhney, Kawal

doi:10.1103/physreva.86.063813

Cited by 131 publications

(163 citation statements)

References 34 publications

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“…To increase the spatial resolution, more sophisticated methods such as speckle scanning can be used (10). This method, however, introduces complexity in the setup and significantly increases the acquisition time.…”

Section: Significancementioning

confidence: 99%

X-ray microtomography using correlation of near-field speckles for material characterization

Zanette

Zdora

Zhou

et al. 2015

Proc. Natl. Acad. Sci. U.S.A.

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Nondestructive microscale investigation of objects is an invaluable tool in life and materials sciences. Currently, such investigation is mainly performed with X-ray laboratory systems, which are based on absorption-contrast imaging and cannot access the information carried by the phase of the X-ray waves. The phase signal is, nevertheless, of great value in X-ray imaging as it is complementary to the absorption information and in general more sensitive to visualize features with small density differences. Synchrotron facilities, which deliver a beam of high brilliance and high coherence, provide the ideal condition to develop such advanced phase-sensitive methods, but their access is limited. Here we show how a small modification of a laboratory setup yields simultaneously quantitative and 3D absorption and phase images of the object. This single-shot method is based on correlation of X-ray near-field speckles and represents a significant broadening of the capabilities of laboratory-based X-ray tomography.X-ray imaging | near-field speckles | phase-contrast imaging | refractive index measurement | microtomography N ear-field speckles are observed when the granular diffraction pattern created by a random phase modulator (diffuser) is recorded in the near-field regime. This speckle intensity pattern has interesting properties: it is not dependent on the propagation distance if the near-field condition is satisfied (1), near-field speckles can be observed also with beams of low longitudinal coherence, and the speckle pattern reflects the spatial properties of the scatterers used to generate it (2).Although speckles are a well-known phenomenon especially in the far field and for different wavelengths, e.g., from radio waves to visible light, the first observation and characterization of nearfield speckles with X-rays was achieved in 2008 by Cerbino et al. who reported on measurements performed with synchrotron radiation (1). After this first experiment, X-ray near-field speckles have been used at synchrotron facilities for, among other applications, coherence measurements, optics characterization, and imaging (3-5).The principle of speckle-based imaging is to quantify the effect on the speckle pattern by the sample through a windowed correlation between a pair of images taken with and without sample. This correlation quantifies the distortion of the speckles caused by the sample and yields accurate information on its refraction and thus phase-shifting properties. Moreover, it simultaneously provides the complementary absorption image of the investigated object (4-6). Because near-field speckles exhibit sufficient contrast also when a beam with a low degree of temporal coherence is used, near-field speckle-based techniques are not limited to largescale synchrotron facilities, but can also be implemented with polychromatic laboratory X-ray sources. Such an experiment has been demonstrated using a high-brightness liquid-metal-jet source (7) making this imaging method available for widespread use (6).Up until now, near...

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Section: Significancementioning

confidence: 99%

X-ray microtomography using correlation of near-field speckles for material characterization

Zanette

Zdora

Zhou

et al. 2015

Proc. Natl. Acad. Sci. U.S.A.

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“…Among the several techniques developed in the last years, a method based on tracking of near-field speckles has several advantages [4][5][6][7][8]. The setup, data acquisition and analysis procedures are relatively simple, it provides multicontrast signals in different directions, and it works well not only at synchrotron facilities, but also at polychromatic laboratory sources [9,10].…”

Section: Introductionmentioning

confidence: 99%

“…The working principles of the method and the procedures to retrieve the image signals are described in detail in Refs. [4,5,9].…”

Section: Introductionmentioning

confidence: 99%

Simulations of multi-contrast x-ray imaging using near-field speckles

Zdora

Thibault

Herzen

et al. 2016

AIP Conference Proceedings

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“…25 In addition, the spatial resolution of existing speckle tracking technique is relatively poor since it is limited to the speckle subset size (over ten pixels around a given pixel). 23,24 Although efforts have been made to improve the spatial resolution by applying 2D raster scans, 26 it is too time consuming. 27 To overcome such drawbacks, an advanced X-ray speckle scanning technique has been recently developed by scanning an abrasive paper transverse to the beam along a single direction.…”

mentioning

confidence: 99%

“…If the field correlation function is taken as incoherent illumination, 26 the speckle intensity pattern gðg; qÞ in the presence of the sample can be considered as convolution of f ðg; qÞ and the scattering angle distribution function hðg; q; t g ; t q ; r g ; r q Þ and written as follows:…”

mentioning

confidence: 99%

Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique

Wang

Kashyap

Sawhney

2016

Applied Physics Letters

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X-ray dark-field contrast tomography can provide important supplementary information inside a sample to the conventional absorption tomography. Recently, the X-ray speckle based technique has been proposed to provide qualitative two-dimensional dark-field imaging with a simple experimental arrangement. In this letter, we deduce a relationship between the second moment of scattering angle distribution and cross-correlation degradation of speckle and establish a quantitative basis of X-ray dark-field tomography using single directional speckle scanning technique. In addition, the phase contrast images can be simultaneously retrieved permitting tomographic reconstruction, which yields enhanced contrast in weakly absorbing materials. Such complementary tomography technique can allow systematic investigation of complex samples containing both soft and hard materials.

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X-ray multimodal imaging using a random-phase object

Cited by 131 publications

References 34 publications

X-ray microtomography using correlation of near-field speckles for material characterization

X-ray microtomography using correlation of near-field speckles for material characterization

Simulations of multi-contrast x-ray imaging using near-field speckles

Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique

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