This X-ray mineralogy study of Tertiary samples recovered from Rockall sites permitted the definition of four mineralogical units and the tracing of the paleoenvironmental evolution in this region. INTRODUCTION The following mineralogical units were defined on the basis of our study: Unit I (upper Paleocene) is characterized by the occurrence of quartz and feldspars as well as by that of clay minerals, namely smectite, illite, kaolinite, and chlorite. Deposits are of a quite marked detrital nature. Unit II (lower Eocene) consists of sediments represented by plagioclase feldspars and zeolites; the major clay mineral components are smectites. These deposits suggest a sedimentation influenced by a basic volcanic environment. The presence of layers rich in kaolinite (Site 555) probably indicates terrigenous inputs developed under leaching warm climates. Unit III (middle Eocene to middle Miocene) is marked by a high carbonate content and dominantly smectite clay minerals: zeolites persist. Sedimentation is of pelagic type attesting to the impact of basic volcanism and/or that of fine-grained terrigenous inputs developed under warm climates with contrasting seasons. Unit IV (from middle/upper Miocene) is also characterized by high carbonate contents. Clay minerals are highly variable (smectite, illite, kaolinite, chlorite). This change in mineralogical composition suggests climatic cooling linked to a change in the hydrological exchanges between the Norwegian Sea and North Atlantic. METHODS Analyses X-ray diffraction was used on a total of 167 Paleocene and Miocene samples. The diffractometer used was a Philips 1310 and operating conditions were as follows: nickle-filtered copper Kα radiation at 40 kv, 20 mA. Total Sediments Dried and pulverized samples of total sediments were analyzed according to the powder diffractogram method. Semiquantitative values of quartz, calcite, and feldspars (K and plagioclase) were estimated from peak heights by comparison with mixed synthetic reference samples. Zeolites were estimated by relative frequencies as abundant, present, or trace on the basis of height of characteristic reflections.