2016
DOI: 10.1117/12.2241728
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X-ray microscopy using reflection targets based on SEM with tungsten filament

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Cited by 2 publications
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“…SEM-based CT is a powerful technique to image specimen morphology in 3D. Through raising interest in the technique over the last years different laboratory-based systems are developed [1][2][3][4] . Since the system can be used as an add-on, it allows to extend SEM modalities like electron imaging, EDX analysis or EBSD by nano-CT.…”
Section: Introductionmentioning
confidence: 99%
“…SEM-based CT is a powerful technique to image specimen morphology in 3D. Through raising interest in the technique over the last years different laboratory-based systems are developed [1][2][3][4] . Since the system can be used as an add-on, it allows to extend SEM modalities like electron imaging, EDX analysis or EBSD by nano-CT.…”
Section: Introductionmentioning
confidence: 99%