X‐ray microanalysis of real materials using Monte Carlo simulations

Gauvin, Raynald

doi:10.1002/sia.2105

Cited by 22 publications

(8 citation statements)

References 29 publications

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“…As emphasized by Tanuma, Powell, and Penn in the quoted paper, the electron stopping power is a relevant quantity in radiation dosimetry and in modeling of electron transport in matter today. In particular, the stopping power has recently been utilized in Monte Carlo simulations of electrons traveling in solid targets with the aim to model processes related to electron-probe microanalysis, Auger-electron spectroscopy, and scanning electron microscopy (for example see Refs [3][4][5][6][7][8][9]). …”

Section: Monte Carlomentioning

confidence: 99%

Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films

Dapor

2008

Surface & Interface Analysis

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Monte Carlo computations of the electron backscattering coefficient as a function of the primary energy in the range 500 eV-5 keV for several bulk targets (Al, Si, Cr, Ni, Cu, Ge, Au) are provided. Monte Carlo simulated backscattering coefficients from several surface thin layers are also provided as a function of the electron primary energy and film thicknesses. While the elastic scattering cross-sections have been calculated by the relativistic partial wave expansion method, the stopping power data utilized by the Monte Carlo code are taken from the literature.

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Section: Monte Carlomentioning

confidence: 99%

Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films

Dapor

2008

Surface & Interface Analysis

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“…In general smaller particles require smaller steps and lower accelerating voltage, and light elements can be analyzed with higher spatial resolution at low accelerating voltage. The best approach is to use Monte Carlo simulation software (Gauvin & Lifshin, 2004) to select proper accelerating voltage to minimize overlapping of generated X-ray volumes. We commonly use step sizes of 0.3 μm with 8 kV, up to 1 μm with 20 kV, or even larger in the case of coarse grained phases.…”

Section: Methodsmentioning

confidence: 99%

A SEM-EDS Study of Cultural Heritage Objects with Interpretation of Constituents and Their Distribution Using PARC Data Analysis

Hoek

Roo²,

Veer³

et al. 2011

Microsc Microanal

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Two cultural heritage objects studied with scanning electron microscopy-energy dispersive spectroscopy~EDS! are presented in this article:~1! archeological iron present in a soil sample and~2! a chip from a purple-colored area of an undisclosed 17th century painting. Novel PARC software was used to interpret the data in terms of quantitative distribution of mineral and organo-mineral phases as well as their chemical composition.The study serves to demonstrate the power of PARC rather than solving specific archeological issues. The observations on archeological iron potentially can assist in~1! studing the source of iron-metal and the style of forging,~2! learning about alteration processes of artifacts in the particular soil from which the sample originated, and~3! determining the nature of the fractures in the Fe-oxide envelope~desiccation of the sample after excavation, or as primary feature caused by volume change from oxidation!. In the paint chip, 11 consecutive layers can be distinguished using the PARC software. In general, each layer consists of a carrier supporting inorganic fragments. In the basal layer the fragments are dominant; in the superimposed layers the carrier usually is. Both organic and inorganic carriers appear to be present. Organic carriers can contain typically inorganic constituents~e.g., Pb, Al!, beyond the chemical spatial resolution of EDS~i.e., ,1 mm!.

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“…Declared by this method, the P/B is constant at any location on the rough surface, and that this ratio is the same as that of bulk material of the same composition having a flat surface. However, using Monte Carlo simulations, Gauvin and Lifshin [11] showed that the P/B is not constant for the rough surfaces. Gauvin demonstrated that the P/B has some weaknesses.…”

Section: Introductionmentioning

confidence: 99%

Study of the Peak to Background (P/B) Method Behavior as a Function of Take-Off Angle, Tilt Angle, Particle Size, and Beam Energy

2021

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Monte Carlo simulations were performed to investigate the behavior of the peak to background ratio (P/B) of particles on a substrate as a function of different variables such as take-off angle, tilt angle, particle size, and beam energy. The results showed that the P/B highly depends on the beam energy, the size of particles, and the composition of the substrates. Results showed that the rate of intensity reduction of the peak is less than the background for a high tilt angle (60 degrees), and thereby, the P/B increases at a high tilt angle. It was shown that by increasing the take-off angle, the P/B initially reduces and then reaches a plateau. Results showed that the P/B highly depends on the size of particles. Analyses showed that by moving the electron beam from the center to the side of the particle, the P/B increases. Finally, the spherical particles have higher sensitivity of the P/B to the beam position than the cubical particles.

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X‐ray microanalysis of real materials using Monte Carlo simulations

Cited by 22 publications

References 29 publications

Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films

Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films

A SEM-EDS Study of Cultural Heritage Objects with Interpretation of Constituents and Their Distribution Using PARC Data Analysis

Study of the Peak to Background (P/B) Method Behavior as a Function of Take-Off Angle, Tilt Angle, Particle Size, and Beam Energy

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