“…Direct microstructural studies on Boom Clay, at the scale of pores and grains, were done using scanning electron microscopy (SEM) on broken surfaces of Boom Clay (Baeyens et al, 1985;Al Mukhtar et al, 1996;De Craen et al, 1999;Romero et al, 1999;Hildenbrand & Urai, 2003), but suffered from difficulties in the interpretation of the images, due to the roughness of the surfaces. Recent developments in the field of micro-focus X-ray computed tomography (μ-CT) (Bésuelle et al, 2006;Jin, 2007;Bugani et al, 2009;Sok et al, 2009;Bell et al, 2011;Cnudde et al, 2011) allow describing the 3D fabrics of clay materials and its evolution under load, but the resolutions achieved are not good enough to resolve porosity. The emergence of ion-beam milling tools, like focussed (FIB) and broad-ion-beam (BIB) cross-sectioning (Holzer et al, 2006(Holzer et al, , 2007(Holzer et al, , 2010Loucks et al, 2009;Desbois et al, 2010a, b;2011a, b;Holzer & Cantoni, 2012) led to an important progress in imaging microstructures and porosity in argillaceous materials, down to the nm-scale resolution.…”