X-ray method for the structural investigation of thin organic films

Abstract

Résumé. 2014 Nous montrons que la simple conjugaison de trois techniques conventionnelles de rayons X permet une étude structurale des films minces lamellaires. La diffraction en transmission du rayonnement synchrotron fournit une détermination de l'arrangement intra-lamellaire, la diffraction en réflexion à petits angles, celle de l'ordre inter-lamellaire et enfin la réflexion critique donne une mesure de la densité nécessaire à l'obtention du nombre d'unités structurales par maille. Nous présentons une illustration de cette méthode à travers l'étude d'un composé organique déposé en couches de Langmuir-Blodgett.Abstract 2014 The structures of thin lamellar films can be determined through a combination of three X-ray experiments using synchrotron radiation. Diffraction experiments in the transmission geometry give the intralamellar ordering, the diffraction at small glancing angles yields the interlamellar organization, and the critical reflection provides the density measurement which is required to obtain the number of structural units per cell. This method is illustrated here with the study of an organic compound deposited in Langmuir-Blodgett films.

Surface Study of Langmuir-Blodgett Films by Electron Microscopy and X-Ray Reflectivity

“…26). This observation confirms our former X-ray experiments which showed that each layer is made of microdomains separated by grain boundaries [2]. Note that such holes have been also observed in dense packed phospholipid monolayers [5].…”

X-ray reflectivity of a Langmuir monolayer on water

“…From a theoretical point of view, very interesting systems involving polar molecules with high dipole moments should give rise to complex phase diagrams in which a supercrystal phase is expected [2]. In all cases the knowledge of the structure of the layer will be necessary to help fully understand these systems [3].…”

Structural investigation of phthalocyaninatopoly(siloxane) Langmuir–Blodgett films by X‐ray diffraction

“…Among them X-ray reflectometry has gained much favor, and high-resolution X-ray reflectometers are now commonplace apparatus. For example, alumina or mica foils have already been used [3]. It is possible to obtain in-plane information in the reflective mode using grazing angle X-ray diffraction [2].…”