X-Ray Measurements Of Charge Diffusion Effects In EEV Ltd. Charge-Coupled Devices

Lumb, D.; Chowanietz, E.; Walls, Alan

doi:10.1117/12.7974148

Cited by 14 publications

(5 citation statements)

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“…The quantum efficiency of the detector extended above 20 keV, allowing us to retrieve X-ray photon spectra by single-photon counting within a range from about 2.2 to 30 keV. The energy resolution of the camera can be calculated by using the Fano-limited resolution formula 33 and yields to about 0.2 keV for 8 keV. We tested the camera by measuring X-rays of elements such as Ca (K α = 3.69 keV and K β = 4.01 keV), up to Ag (K α = 22.16 keV and K β = 24.94 keV).…”

Section: Methodsmentioning

confidence: 99%

Combined laser-based X-ray fluorescence and particle-induced X-ray emission for versatile multi-element analysis

Puyuelo-Valdes

Vallières

Salvadori

et al. 2021

Sci Rep

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Particle and radiation sources are widely employed in manifold applications. In the last decades, the upcoming of versatile, energetic, high-brilliance laser-based sources, as produced by intense laser–matter interactions, has introduced utilization of these sources in diverse areas, given their potential to complement or even outperform existing techniques. In this paper, we show that the interaction of an intense laser with a solid target produces a versatile, non-destructive, fast analysis technique that allows to switch from laser-driven PIXE (Particle-Induced X-ray Emission) to laser-driven XRF (X-ray Fluorescence) within single laser shots, by simply changing the atomic number of the interaction target. The combination of both processes improves the retrieval of constituents in materials and allows for volumetric analysis up to tens of microns and on cm2 large areas up to a detection threshold of ppms. This opens the route for a versatile, non-destructive, and fast combined analysis technique.

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Section: Methodsmentioning

confidence: 99%

Combined laser-based X-ray fluorescence and particle-induced X-ray emission for versatile multi-element analysis

Puyuelo-Valdes

Vallières

Salvadori

et al. 2021

Sci Rep

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“…By contrast, little work has been done on the experimentally verifying the proposed theoretical solutions. Results from indirectly comparing the diffusion model with experimental data have been published, for instance, in [5] and [6], where the measured shape of the CCD response to the monochromatic X-ray 0018-9383/03$17.00 © 2003 IEEE illumination was compared with a simulation. However, with those approaches, it is extremely difficult to separate diffusion effects from the numerous other mechanisms which determine the X-ray response function of the device.…”

Section: Introductionmentioning

confidence: 99%

An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs

Prigozhin

Butler

Kissel

et al. 2003

IEEE Trans. Electron Devices

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We have experimentally studied the diffused electron clouds formed by X-ray photons interacting within the undepleted bulk of silicon beneath the depleted region of an X-ray CCD. Usually, such events are spread over multiple pixels and are often rejected in data analysis because of incomplete charge collection in the undepleted bulk. Unusual CCD clocking mode where every 100 sequential rows were summed in the serial register allowed us to reduce the charge distribution to a one-dimensional (1-D) representation without losing any information, resulting in a dramatically simplified analysis and improved signal/noise ratio. We have shown that events from the undepleted bulk can be used for retrieving information regarding the energy of the corresponding X-ray photon. In our study, the and lines emitted by the radioactive 55 source could be clearly separated. Such an analysis can markedly improve the sensitivity of partially depleted CCDs at higher energies. By averaging many events that originate at the same distance from the surface of the device, we were able to extract the shape of the charge cloud after the completion of the diffusion process. The results were found to be in good agreement with theoretical predictions.

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“…The detector had a usable quantum efficiency range from about 2.2 keV to 20 keV for retrieving x-ray photon spectra by single photon counting. The Fano-limited resolution formulation [13] gives a resolution of about 0.2 keV for 8 keV. We verified the calibration of the camera by measuring x-rays produced by Ca (K α = 3.69 keV and K β = 4.01 keV), up to Ag (K α = 22.16 keV and K β = 24.94 keV).…”

Section: Methodsmentioning

confidence: 83%

Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission

et al. 2022

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In this paper, we demonstrate the feasibility of quantitative laser-based X-ray Fluorescence (XRF) combined with Particle-Induced X-ray Emission (PIXE) (called XPIF for X-ray and Particle-Induced Fluorescence) spectroscopy analysis for elemental composition in solid samples. A multi-hundred TW laser system accelerated protons and produced X-rays that were impinging on solid samples, inducing characteristic line emissions of the elements contained in the material. The X-ray yield obtained from the characteristic emissions for each element can be related to its mass concentration using both the thick PIXE and thick XRF formalism. This is performed by using of an iterative numerical procedure. We tested the validity of our method on three homogeneous metallic materials, Stainless steel, Bronze and Brass. The mass proportions of these samples retrieved by our analysis (XPIF) is within the errors bars compared with a commercial Energy Dispersive X-ray (EDX) spectrometer.

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X-Ray Measurements Of Charge Diffusion Effects In EEV Ltd. Charge-Coupled Devices

Cited by 14 publications

References 0 publications

Combined laser-based X-ray fluorescence and particle-induced X-ray emission for versatile multi-element analysis

Combined laser-based X-ray fluorescence and particle-induced X-ray emission for versatile multi-element analysis

An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs

Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission

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