X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source

Liu, Wenjun; Tischler, J. Z.; Xu, Ruqing

doi:10.1142/9781908979636_0002

Cited by 11 publications

(4 citation statements)

References 43 publications

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“…X-ray diffraction measurements. m-Laue diffraction measurements were made at beamline 34-ID-E at the Advanced Photon Source, Argonne National Lab, Illinois, USA 34 . A polychromatic X-ray beam (7-30 keV) focussed to a near Lorentzian-shaped probe spot with full width at half maximum (FWHM) of 0.6 mm vertically and 0.4 mm horizontally was used to illuminate the sample (see Methods section and Supplementary Fig.…”

Section: Resultsmentioning

confidence: 99%

X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation

et al. 2013

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Understanding and controlling the behaviour of dislocations is crucial for a wide range of applications, from nano-electronics and solar cells to structural engineering alloys. Quantitative X-ray diffraction measurements of the strain fields due to individual dislocations, particularly in the bulk, however, have thus far remained elusive. Here we report the first characterization of a single dislocation in a freestanding GaAs/In 0.2 Ga 0.8 As/GaAs membrane by synchrotron X-ray micro-beam Laue diffraction. Our experimental X-ray data agrees closely with textbook anisotropic elasticity solutions for dislocations, providing one of few experimental validations of this fundamental theory. On the basis of the experimental uncertainty in our measurements, we predict the X-ray beam size required for threedimensional measurements of lattice strains and rotations due to individual dislocations in the material bulk. These findings have important implications for the in situ study of dislocation structure formation, self-organization and evolution in the bulk.

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Section: Resultsmentioning

confidence: 99%

X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation

et al. 2013

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“…There are multiple synchrotron beamlines dedicated to Laue micro-diffraction [10][11][12][13]. However, currently these facilities are not specifically optimized for measurements on materials at high pressures.…”

Section: Experimental Facilities and Proceduresmentioning

confidence: 99%

“…Improvement of both spatial and time resolution will provide better details of the phase transition mechanisms and interface developments thereof. For example, implementation of X-ray polychromatic beams focused down below 100 nm [12] may provide details of the mechanism of the pressure induced grain enlargement observed across the α → ω phase transition in Zr.…”

Section: Future Developmentsmentioning

confidence: 99%

Mechanisms of Pressure-Induced Phase Transitions by Real-Time Laue Diffraction

2019

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Synchrotron X-ray radiation Laue diffraction is a widely used diagnostic technique for characterizing the microstructure of materials. An exciting feature of this technique is that comparable numbers of reflections can be measured several orders of magnitude faster than using monochromatic methods. This makes polychromatic beam diffraction a powerful tool for time-resolved microstructural studies, critical for understanding pressure-induced phase transition mechanisms, by in situ and in operando measurements. The current status of this technique, including experimental routines and data analysis, is presented along with some case studies. The new experimental setup at the High-Pressure Collaborative Access Team (HPCAT) facility at the Advanced Photon Source, specifically dedicated for in situ and in operando microstructural studies by Laue diffraction under high pressure, is presented.

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“…The differential aperture X-ray microscopy (DAXM) was performed at beam line 34-ID-E at the Advanced Photon Source (APS), Argonne National Laboratory [18]. In the DAXM experiment, the X-rays were focused at the specimen using two non-dispersive Kirkpatrick-Baez (K-B) focusing mirrors.…”

Section: Daxm Experimentsmentioning

confidence: 99%

Three-dimensional local residual stress and orientation gradients near graphite nodules in ductile cast iron

et al. 2016

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A synchrotron technique, differential aperture X-ray microscopy (DAXM), has been applied to characterize the microstructure and analyze the local mesoscale residual elastic strain fields around graphite nodules embedded in ferrite matrix grains in ductile cast iron. Compressive residual elastic strains are measured with a maximum strain of ~ 6.5-8 × 10-4 near the graphite nodules extending into the matrix about 20 µm, where the elastic strain is near zero. The experimental data are compared with a strain gradient calculated by a finite element model, and good accord has been found but with a significant over prediction of the maximum strain. This is discussed in terms of stress relaxation during cooling or during storage by plastic deformation of the nodule, the matrix or both. Relaxation by plastic deformation of the ferrite is demonstrated by the formation of low energy dislocation cell structure also quantified by the DAXM technique.

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X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source

Cited by 11 publications

References 43 publications

X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation

X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation

Mechanisms of Pressure-Induced Phase Transitions by Real-Time Laue Diffraction

Three-dimensional local residual stress and orientation gradients near graphite nodules in ductile cast iron

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