2011
DOI: 10.1117/12.890134
|View full text |Cite
|
Sign up to set email alerts
|

X-ray laser-induced ablation of lead compounds

Abstract: The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO 4 and PbI 2 exposed to ultra-short pulses of extreme ultraviolet radi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

2
0
0

Year Published

2012
2012
2022
2022

Publication Types

Select...
6

Relationship

3
3

Authors

Journals

citations
Cited by 10 publications
(2 citation statements)
references
References 24 publications
2
0
0
Order By: Relevance
“…In the case of B 4 C at 12 keV, only a lower bound could be given due to the lack of visible damage. We also note that the estimated beam size and shape were consistent with those determined by normal incidence measurements taken on lead(II) iodide 9 and on silicon oxide. 10 It is of note that the fluence damage thresholds are far higher than the values obtained for normal incidence measurements or measurements conducted at lower photon energies.…”
supporting
confidence: 68%
“…In the case of B 4 C at 12 keV, only a lower bound could be given due to the lack of visible damage. We also note that the estimated beam size and shape were consistent with those determined by normal incidence measurements taken on lead(II) iodide 9 and on silicon oxide. 10 It is of note that the fluence damage thresholds are far higher than the values obtained for normal incidence measurements or measurements conducted at lower photon energies.…”
supporting
confidence: 68%
“…Moreover, single-shot ablation thresholds of selected high-Z high-density materials [17], which strongly absorb the LCLS radiation, were determined by means of LCLS pulse energy distributions. Other threshold values [34] obtained during the commissioning validated the Transfer-GMD measurements as well. Figure 6 shows the transmission of the SXR instrument for different photon energies, summarizing the comparison of the FEL average pulse energy measured by the Transfer-GMD and the LCLS gas detectors.…”
Section: Soft X-ray Transmissionsupporting
confidence: 59%