X-Ray Interferometric Investigations of Structural Distortions in Semiconductor Crystals Caused by Constant Electric and Magnetic Fields

Akshakyan, E . Z.; Aboyan, A. O.; Bezirganyan, P.A.

doi:10.1515/9783112480823-006

March 16 1988

DOI: 10.1515/9783112480823-006

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X-Ray Interferometric Investigations of Structural Distortions in Semiconductor Crystals Caused by Constant Electric and Magnetic Fields

E . Z. Akshakyan¹,

A. O. Aboyan²,

P.A. Bezirganyan³

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X-Ray Interferometric Investigations of Structural Distortions in Semiconductor Crystals Caused by Constant Electric and Magnetic Fields

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