X-ray imaging test for a single-stage MEMS X-ray optical system

Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Ishizu, Kensuke; Moriyama, Teppei; Maeda, Yoshitomo; Hayashi, T.; Sato, Toshiki; Mita, Makoto; Yamasaki, Noriko Y.; Mitsuda, Kazuhisa; Horade, Mitsuhiro; Saito, Susumu; Riveros, Raul E.; Boggs, Taylor; Yamaguchi, Hitomi; Kanamori, Yoshiaki; Nakajima, Kazuo; Maeda, Ryutaro

doi:10.1109/omems.2010.5672138

2010 International Conference on Optical MEMS and Nanophotonics 2010

DOI: 10.1109/omems.2010.5672138

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X-ray imaging test for a single-stage MEMS X-ray optical system

Ikuyuki Mitsuishi

Yuichiro Ezoe

Kensuke Ishizu

et al.

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X-ray imaging test for a single-stage MEMS X-ray optical system

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