X-ray Fluorescence Spectroscopy of Novel Materials

Abstract

This review focuses on the capabilities and potential of soft x-ray fluorescence spectroscopy for the study of the electronic structure and chemical bonding of novel materials. The basic principle of x-ray fluorescence measurements using synchrotron radiation and the corresponding instrumentation issues are outlined. Particular attention is given to x-ray spectroscopic studies of the electronic structure and characterization of nanostructures, thin films, interfaces, adsorbates, half-metallic ferromagnets, and impurities in alloys, superconductors, and semiconductors and the chemical bonding in biomaterials and liquids.

Effect of h-BN Additive on Hydrogen Sorption by Ti under Mechanical Treatment in H2/He Flow

“…All emission spectra were normalized to the number of photons falling on the sample, monitored by a highly transparent gold mesh in front of the sample. Details of this method can be found elsewhere …”

Data-Centric Architecture for Self-Driving Laboratories with Autonomous Discovery of New Nanomaterials

“…The crystal structure and chemical composition of nanoparticles can be characterized using ensemble or single-particle techniques. There is a large group of X-ray-based spectroscopy (diffraction [ 27 ], absorption [ 28 ], fluorescence [ 29 ], emission [ 30 ]) spectroscopy, optical emission spectroscopy [ 31 ], and atomic and nuclear magnetic resonance spectroscopy [ 32 ] among the ensemble techniques. Various scanning and transmission electron microscopy techniques and optical force microscopy [ 33 ] techniques belong to single-particle nanoparticles characterization.…”

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

“…Kurmaev 57 wrote a review article on the analysis of novel materials by soft X-ray fluorescence spectrometry using synchrotron radiation and related instrumentation. Materials discussed cover a wide range including: nano-particles, alloys, superconductors, half-metallic ferromagnets, and semiconductors.…”

“…Kurmaev reviewed the use of XRF for the analysis of the electronic structure and composition of thin films, semiconductors, superconductors, half metallic ferromagnets and alloys. 57 Also included in the review, which had 136 references, were the basic principles of XRF using synchrotron radiation and the instrumentation requirements. A second review of synchrotron-based techniques (34 references) has been prepared by Buonassisi et al 248 who focussed particularly on those techniques used to measure the diffusion length and chemical character of metal clusters in multi-crystalline silicon solar cells.…”