X‐ray fluorescence analysis with sample excitation using radiation from a secondary target

Abstract

This paper presents a scheme of an x‐ray spectrometer with exchangeable secondary targets and investigation of its characteristics. A high‐voltage power source with a voltage up to 75 kV and x‐ray tubes with power up to 2.5 kW were used in the spectrometer to generate the primary x‐ray radiation. The exchangeable secondary targets made it possible to get monochromatic radiation with a rather high degree of the spectral contrast. The use of tubes with different anodes materials (chromium, tungsten and rhodium) and different secondary targets provides efficient performance for the analysis of a range of concentrations of elements with atomic numbers 13 < Z < 92. In this case, it was possible to optimize the sample analysis for definite groups of elements, reaching detection limits (DL) of 10−6 g/g in aqueous solutions. According to the sensitivity (DL), this device can act as a spectrometer with total external reflection of the primary beam (TXRF spectrometer). However, its design is simpler, it has better optical efficiency, its adjustment is simple and convenient and it has a high operating efficiency. Besides, the design of the device makes it possible to perform simultaneously, if necessary, x‐ray fluorescence and x‐ray absorption analyses of a sample. Examples of the application of the device for the determination of heavy‐metal content in the aqueous solutions and measurement of thickness of films are presented in this paper. Copyright © 2007 John Wiley & Sons, Ltd.

Atomic spectrometry update. X-ray fluorescence spectrometry

“…Monochromators are used to isolate characteristic tube lines; polarised configurations are popular, where the sample is excited by radiation scattered from a selection of targets of low atomic number elements; secondary targets; Bragg reflectors or polycapillary optics and total external reflection of the primary beam (TXRF) are all testament to the innovative configurations available today. Vasin et al 5 presented examples of the application of their system, using sample excitation from a secondary target, for the determination of heavy-metal concentrations in aqueous solutions and for the measurement of film thickness. This configuration provided analysis of a sample using both fluorescence and transmission spectra.…”

Target technology development for the research of high energy density physics and inertial fusion at the RFNC–VNIIEF

“…Use of a probing beam with small diameter enables to carry out scanning on the area of the sample and to develop not destroying control of finished multi-layered and multistage targets (Vasin et al, 2007). They permit to define the composition and optical thickness of the films.…”

“…The combined application of X-ray techniques of fluorescence and absorption analysis permits to measure optical films thickness in a range of 6 Â 10 27 -0.1 g/cm 2 (6 Â 10 24 -100 mm) with accuracy of 1 -2% (Vasin et al, 2007). …”

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