A LiFZOO analyzing crystal, which was treated to enhance heavy element sensitivity, was evaluated for application to the analysis of geological silicate materials prepared as pressed pellets. The treated crystal produced up to two-fold higher sensitivities along with backgrounds which were approximately two-fold higher. Lower limits of detection were produced, and the treated crystal is recommended for the routine determination of the elements Ni through Nb using K emission and for elements having L emissions in the same energy range. The limit of detection for Nb was reduced from 0.9 to 0.6 ppm (100 s data acquisition) when the treated crystal was used in place of the standard crystal. For elements with lower emission energies, there was a smaller, but significant, lowering of the limit of detection when the treated crystal was used. The advantage of the treated crystal decreased as the emission energy decreased.