X-ray fluorescence analysis of samples for beta spectrometry and its application to precise Monte Carlo simulations

Novotný, Pavel

doi:10.1016/j.radphyschem.2021.109930

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2022

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“…The second is based on the detailed characterization of each sample prepared by drop deposition, which is used to improve the accuracy of the Monte Carlo calculation of reference spectra. As part of the research on beta spectra metrology, the suitability of high-resolution X-ray fluorescence 2D scanning for this purpose was studied in detail and the results obtained have been presented in [12].…”

Section: Discussionmentioning

confidence: 99%

Determination of radionuclide impurities in pure beta radiation sources by semiconductor spectrometry

Novotný

2022

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In many applications, the radionuclidic purity of a radioactive substance is a crucial property. It involves, for example, the production of radiopharmaceuticals or reference standards used in metrology. However, the identification of admixtures is not straightforward for certain nuclides. The paper presents a technique for the determination of radionuclide impurities in the mixtures of pure beta-emitting nuclides. The proposed method is based on the comparison of measured beta spectra with the detector responses to individual radionuclides. These are obtained using a Monte Carlo calculation performed in the geometry corresponding to the accurate description of a measuring assembly.

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Section: Discussionmentioning

confidence: 99%

Determination of radionuclide impurities in pure beta radiation sources by semiconductor spectrometry

Novotný

2022

APP

View full text Add to dashboard Cite

show abstract

X-ray fluorescence analysis of samples for beta spectrometry and its application to precise Monte Carlo simulations

Cited by 1 publication

References 5 publications

Determination of radionuclide impurities in pure beta radiation sources by semiconductor spectrometry

Determination of radionuclide impurities in pure beta radiation sources by semiconductor spectrometry

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