X-Ray Diffraction Microscopy

Armstrong, R.D.; Wu, Carl

doi:10.1007/978-1-4615-8693-7_8

Cited by 35 publications

(3 citation statements)

References 235 publications

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“…Early reviews on the several methods of reflection and transmission X-ray topography are given in references [34,35]. A recent review is given by Moore [36], particularly relating to orders of magnitude reduction in both time and beam divergence capabilities that are available with synchrotron radiation.…”

Section: Polycrystal Application Of X-ray Topographic Imagingmentioning

confidence: 99%

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Armstrong

2014

Symmetry

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Several materials science type research topics are described in which advantageous use of crystal symmetry considerations has been helpful in ferreting the essential elements of dislocation behavior in determining material properties or for characterizing crystal/polycrystalline structural relationships; for example: (1) the mechanical strengthening produced by a symmetrical bicrystal grain boundary; (2) cleavage crack formation at the intersection within a crystal of symmetrical dislocation pile-ups; (3) symmetry aspects of anisotropic crystal indentation hardness measurements; (4) X-ray diffraction topography imaging of dislocation strains and subgrain boundary misorientations; and (5) point and space group aspects of twinning. Several applications are described in relation to the strengthening of grain boundaries in nanopolycrystals and of multiply-oriented crystal grains in polysilicon photovoltaic solar cell materials. A number of crystallographic aspects of the different topics are illustrated with a stereographic method of presentation.

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Section: Polycrystal Application Of X-ray Topographic Imagingmentioning

confidence: 99%

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Armstrong

2014

Symmetry

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“…The observation via x-ray diffraction contrast of lattice strains produced by the residual dislocation structures at plastic indentations potentially provides an additional technique for deciphering the role of dislocations in effecting the hardness of crystals [211]. In particular, the back-reflection method, whether done by the conventional Berg-Barrett employing characteristic radiation or by the crystal-monochromated, asymmetric crystal topography (ACT) method [212], affords insight into the generally more complicated nature of internal dislocation interactions determining the yield and strain hardening properties involved in determining crystal hardness values; see reference 131 for diffraction contrast produced at hardness indentations in an MgO crystal under different applied loads. Raghuram and Armstrong [213] matched the extent of etch pit rosettes and x-ray diffraction contrast at indentations on MgO.…”

Section: X-ray Diffraction (Topography)mentioning

confidence: 99%

Elastic, Plastic, Cracking Aspects of the Hardness of Materials

Armstrong

Elban

Walley

2013

Int. J. Mod. Phys. B

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The hardness properties of materials are tracked from early history until the present time. Emphasis is placed on the hardness test being a useful probe for determining the local elastic, plastic and cracking properties of single crystal, polycrystalline, polyphase or amorphous materials. Beginning from connection made between individual hardness pressure measurements and the conventional stress–strain properties of polycrystalline materials, the newer consideration is described of directly specifying a hardness-type stress–strain relationship based on a continuous loading curve, particularly, as obtained with a spherical indenter. Such effort has received impetus from order-of-magnitude improvements in load and displacement measuring capabilities that are demonstrated for nanoindentation testing. Details of metrology assessments involved in various types of hardness tests are reviewed. A compilation of measurements is presented for the separate aspects of Hertzian elastic, dislocation-mechanics-based plasticity and indentation-fracture-mechanics-based cracking behaviors of materials, including elastic and plastic deformation rate effects. A number of test applications are reviewed, most notably involving the hardness of thin film materials and coatings.

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“…Their microstructure and the most important properties (photoconductivity, luminescence, etc.) are known to depend more on the concentration of the precursors, technology, and photoconductivity thermal activation at temperatures of 800-900 K. The photosensitivity of these films depends on the annealing time in air, increasing along with annealing time increase, reaching the maximum value during annealing for 10-20 min, and then decreasing in the course of a longer heat treatment [26,27].…”

Section: Introductionmentioning

confidence: 99%

Morphological Features of Polycrystalline CdS1−xSex Films Obtained by Screen-Printing Method

et al. 2023

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The results of studying the morphological peculiarities of polycrystalline CdS1−xSex films, obtained by screen printing, with well-formed grain boundaries of high structural quality are presented here. The developed method for screen printing provides the formation of polycrystalline films of a specified area per cycle, provided that there is a possibility for varying their thickness from tens of microns to units, which allows reducing the solar cell’s thickness and facilitating the process of its connection with the substrate. Therefore, the application of the films to a sitall substrate by screen printing contributes to reducing the product weight and facilitating the process of joining sheet materials intended for solar panels, namely attaching the lasing element to the substrate. The purpose of this work is to study the morphological peculiarities of polycrystalline CdS1−xSex films obtained by an optimized screen-printing method and to create a model of their formation process. The structural and morphological peculiarities of the samples were studied using electron microscopy, AFM, XPA, and XFS. As a result of the work, based on the obtained experimental data, a model of the film formation process was developed. The model validity is justified by the conformity of the data of the experiment performed on its basis.

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X-Ray Diffraction Microscopy

Cited by 35 publications

References 235 publications

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Elastic, Plastic, Cracking Aspects of the Hardness of Materials

Morphological Features of Polycrystalline CdS1−xSex Films Obtained by Screen-Printing Method

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