X-ray diffraction measurements of plasticity in shock-compressed vanadium in the region of 10–70 GPa

Abstract

We report experiments in which powder-diffraction data were recorded from polycrystalline vanadium foils, shock-compressed to pressures in the range of 10–70 GPa. Anisotropic strain in the compressed material is inferred from the asymmetry of Debye-Scherrer diffraction images and used to infer residual strain and yield strength (residual von Mises stress) of the vanadium sample material. We find residual anisotropic strain corresponding to yield strength in the range of 1.2 GPa–1.8 GPa for shock pressures below 30 GPa, but significantly less anisotropy of strain in the range of shock pressures above this. This is in contrast to our simulations of the experimental data using a multi-scale crystal plasticity strength model, where a significant yield strength persists up to the highest pressures we access in the experiment. Possible mechanisms that could contribute to the dynamic response of vanadium that we observe for shock pressures ≥30 GPa are discussed.