X-ray diffraction data and analysis to support phase identification in FeSe and Fe7Se8 epitaxial thin films

Abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe7Se8 phases in a double epitaxy configuration with the β-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe7Se8 simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the β-FeSe phase are shown.

Temporal Spinodal Decomposition of the Fe1+yTe1−xSex Crystals and its Impact on Superconducting Properties

“…Note, that the powder XRD studies detect often the presence of extraneous phases, such as Fe 3 O 4 , [ 35 ] Fe 7 Se 8 , [ 34 ] and Fe 3 Se 2.1 Te 1.8 . [ 4 ] The Bragg reflection positions of these possible admixtures are marked by arrows on the S2 diffraction pattern (Figure 3b).…”