X-Ray Diffraction and Diffusion in Metal Film Layered Structures

Dinklage, John B.; Frerichs, Rudolf

doi:10.1063/1.1729782

Cited by 55 publications

(9 citation statements)

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“…Measurement of interdiffusion in compositionally modulated multilayer structures using x-ray scattering is one technique to study diffusion lengths much shorter than the detection limit of sectioning and profiling techniques. [10][11][12][13] Several attempts have been made to study interdiffusion in chemically inhomogeneous multilayers. In a study by Mizoguchi et al, 14 interdiffusion and structural relaxation have been studied in 3d transition metal (TM)/Zr multilayers in the composition range of TM 67 Zr 33 using x-ray diffraction (XRD) technique.…”

Section: Introductionmentioning

confidence: 99%

“…Neutron reflectivity is a nondestructive technique, which can be used for studying self-diffusion in a chemically homogeneous multilayer with a resolution as small as 0.1 nm, by taking advantage of isotopic labeling. Greer et al 10,16,17 have demonstrated the application of neutron reflectivity, measuring self-diffusion in amorphous NiZr multilayers. In another study by Baker et al 18 self-diffusion of amorphous 11 B on 10 B in isotopically enriched thin films of 11 B/ 10 B on Si was investigated.…”

Section: Introductionmentioning

confidence: 99%

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Iron self-diffusion in amorphousFeZr∕Fe57Zrmultilayers measured by neutron reflectometry

Gupta

Stahn

et al. 2004

Phys. Rev. B

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Self-diffusion of iron in natural Fe 67 Zr 33 / 57 Fe 67 Zr 33 multilayers has been investigated by neutron reflectometry. The as-deposited multilayer is amorphous in nature. It remains amorphous up to a temperature of 573 K and thereafter nanocrystallizes with an average grain size of 6 nm. The self-diffusion in the multilayers has been measured after isothermal vacuum annealing below the nanocrystallization temperature by monitoring the decay of the intensity of the first order Bragg peak, arising due to the isotopic periodicity. It has been found that the diffusivity at different temperatures follows an Arrhenius-type behavior with the preexponential factor D 0 =5ϫ 10 −18±1 m 2 s −1 and the activation energy E = 0.38± 0.05 eV, respectively. These values of E and D 0 follow the well-known E-D 0 correlation and on the basis of this correlation it is suggested that diffusion mechanism in the present case is not highly collective but involves a rather small group of atoms.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Iron self-diffusion in amorphousFeZr∕Fe57Zrmultilayers measured by neutron reflectometry

Gupta

Stahn

et al. 2004

Phys. Rev. B

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“…The two components diffused into each other over a period of weeks. Thereafter some improvements were made on layered metal film optics for soft X-rays 34. Langmuir-Blodgett multilayers56 were created, using long-chain water insoluble fatty acid molecules.…”

Section: Multilayer Technique For X-raysmentioning

confidence: 99%

“…Thereafter some improvements were made on layered metal film optics for soft X-rays. 3,4 Langmuir-Blodgett multilayers 5,6 were created, using longchain water insoluble fatty acid molecules. As a result of technological limitations, further development and research progressed very slowly until the 1970s.…”

Section: Multilayer Technique For X-raysmentioning

confidence: 99%

Basic principle and performance characteristics of multilayer beam conditioning optics

2002

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Multilayer optics is one of the widely applied optics for conditioning an X-ray beam in the region of X-ray diffraction. Multilayer optics offers a well-balanced performance. The beam conditioned by a multilayer optic is characterized by low divergence, good spectrum purity, and high intensity. This article will start with a short historical note of the development of X-ray multilayer and a summary on the basic performance characteristics of X-ray multilayer, then move on to the discussion on the design principle of one- and two-dimensional optics. Both parallel beam optics and focusing optics will be addressed. As examples, selected applications of multilayer optics are also briefly discussed. Finally, the main problems associated with the application of multilayer optics are identified and the future developments are discussed.

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“…The idea of an engineered selectable d-spacing analyzing crystal was, of course, well-known, following the work of DuMond and Youtz [19] in 1940 and Dinklage and Frericks in 1963 [20]. It was a time of innovation.…”

Section: X-ray Analysis In the 1970smentioning

confidence: 99%

History and Development of X‐Ray Fluorescence Spectrometry

Jenkins¹

1999

X‐Ray Fluorescence Spectrometry

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X-ray fluorescence spectrometry provides a means of identification of an element, by measurement of its characteristic X-ray emission wavelength or energy. The method allows the quantification of a given element by first measuring the emitted characteristic line intensity and then relating this intensity to elemental concentration. While the roots of the method go back to the early part of this century [1,2,3], it is only during the last 25 years or so that the technique has gained major significance as a routine means of elemental analysis. The first use of the X-ray spectrometric method dates back to the classic work of Henry Moseley in 1912 (see Section 1.3). In Moseley's original X-ray spectrometer, the source of primary radiation was a cold cathode tube in which the source of electrons was residual air in the tube itself, with the specimen for analysis forming the target of the tube. Radiation produced from the specimen then passed through a thin gold window onto an analyzing crystal, where it was diffracted to the detector. At about the same period in time, after the application of the ability to image through opaque objects had demonstrated significant utility, Barkla observed [4] that when elements were irradiated with primary X-rays, the secondary radiation varied in penetration power (as measured by absorbing the rays with foils). Figure 5.1 shows Barkla's classic experiment in which he demonstrated that the total attenuation of the incident X-ray beam was different depending on whether the absorber was placed either between the source and the scatterer, or between the scatterer and detector. From this observation, Barkla concluded that the scatterer was not only scattering, but it was also modifying the beam. He further concluded that hard primary radiation could produce soft secondary radiation. It was Barkla who coined the term characteristic rays. He also observed that there were two components to this radiation, a harder and a softer one (specified by their ability to penetrate the foils). He chose to name them K and L rays, respectively, starting in the middle of the alphabet, as he assumed that harder and softer radiation would be discovered.One of the major problems in the use of electrons for the excitation of characteristic X-radiation is that the process of conversion of electron energy 75 X-Ray Fluorescence Spectrometry, Second Edition

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X-Ray Diffraction and Diffusion in Metal Film Layered Structures

Cited by 55 publications

References 1 publication

Iron self-diffusion in amorphousFeZr∕Fe57Zrmultilayers measured by neutron reflectometry

Iron self-diffusion in amorphousFeZr∕Fe57Zrmultilayers measured by neutron reflectometry

Basic principle and performance characteristics of multilayer beam conditioning optics

History and Development of X‐Ray Fluorescence Spectrometry

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