X-ray diffraction

Pfluger, C. E.

doi:10.1021/ac60313a023

Cited by 1 publication

(2 citation statements)

References 316 publications

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“…As was noted in the last review (283), development of electronic image intensifying devices with the goal of instantaneous video display of diffraction images is well under way. Recent developments may be found in papers dealing with solid-state image intensifiers (60,263) and a new and potentially important device which incorporates an X-ray sensitive fiber optic faceplate (299).…”

Section: Instrumentationmentioning

confidence: 98%

“…The results of the International Union of Crystallography Commission on Crystallographic Apparatus Single-Crystal Intensity Measurement Project which were published in 1970 (7,727) and were reported in the previous review (283), pointed out that the estimated standard deviations of the positional parameters obtained in a leastsquares refinement are generally too small by a factor of approximately two. Abrahams (2) came to the same conclusion in his investigation of the systematic error differences between two refined sets of positional parameters for NasPOaCC^-eHaO.…”

Section: Single-crystal Structure Analysismentioning

confidence: 99%

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X-ray diffraction

Pfluger¹

1974

Anal. Chem.

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This review presents a general overview of the field of X-ray diffraction with emphasis being on the directions in which applications and research in the areas of instrumentation, analysis, powder methods, topographic methods, determination of molecular structure, etc., have been going rather than presenting a comprehensive listing of all references in which X-ray diffraction was utilized. To do so would have been a formidable task as the use of X-ray diffraction methods in solving problems in chemistry, material sciences, geology, industry, etc., is extremely widespread, as becomes evident after even a rather superficial scan of the literature. This review covers the period of January 1972 through December 1973, mainly by the appearance of an abstract during this time, although several

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Section: Instrumentationmentioning

confidence: 98%

Section: Single-crystal Structure Analysismentioning

confidence: 99%